WEKO3
アイテム
Emissive probe as a reference electrode in probe measurements
https://nitech.repo.nii.ac.jp/records/4247
https://nitech.repo.nii.ac.jp/records/4247d853763e-ba4f-404a-8620-27cfe12286aa
| 名前 / ファイル | ライセンス | アクション |
|---|---|---|
本文_fulltext (491.5 kB)
|
Copyright (1993) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.The following article appeared in Review of Scientific Instruments, 64(11), pp.3274- 3277 ; 1993 and may be found at http://link.aip.org/link/?rsi/64/3274
|
| Item type | 学術雑誌論文 / Journal Article(1) | |||||||||
|---|---|---|---|---|---|---|---|---|---|---|
| 公開日 | 2012-11-06 | |||||||||
| タイトル | ||||||||||
| タイトル | Emissive probe as a reference electrode in probe measurements | |||||||||
| 言語 | en | |||||||||
| 言語 | ||||||||||
| 言語 | eng | |||||||||
| 資源タイプ | ||||||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||||||
| 資源タイプ | journal article | |||||||||
| 著者 |
Kimura, Takashi
× Kimura, Takashi
× Oe, K.
|
|||||||||
| 著者別名 | ||||||||||
| 姓名 | 木村, 高志 | |||||||||
| bibliographic_information |
en : REVIEW OF SCIENTIFIC INSTRUMENTS 巻 64, 号 11, p. 3274-3277, 発行日 1993-11 |
|||||||||
| 出版者 | ||||||||||
| 出版者 | American Institute of Physics | |||||||||
| 言語 | en | |||||||||
| ISSN | ||||||||||
| 収録物識別子タイプ | ISSN | |||||||||
| 収録物識別子 | 0034-6748 | |||||||||
| item_10001_source_id_32 | ||||||||||
| 収録物識別子タイプ | NCID | |||||||||
| 収録物識別子 | AA00817730 | |||||||||
| 出版タイプ | ||||||||||
| 出版タイプ | VoR | |||||||||
| 出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||||||
| item_10001_relation_34 | ||||||||||
| 関連タイプ | isIdenticalTo | |||||||||
| 識別子タイプ | DOI | |||||||||
| 関連識別子 | http://dx.doi.org/10.1063/1.1144473 | |||||||||
| 関連名称 | 10.1063/1.1144473 | |||||||||
| 内容記述 | ||||||||||
| 内容記述タイプ | Other | |||||||||
| 内容記述 | An emissive probe is used as a reference electrode in probe measurements. Some conditions for its use are discussed in a typical plasma. Application of the method to a He positive column results in good agreement of probe current-voltage characteristics with those conventionally detected with respect to the discharge electrode. | |||||||||
| 言語 | en | |||||||||
