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  1. 研究論文

Optical properties of nanocrystalline diamond films by prism coupling technique

https://nitech.repo.nii.ac.jp/records/5117
https://nitech.repo.nii.ac.jp/records/5117
6cfac3cd-5d4b-40ca-a052-7c9293eee137
名前 / ファイル ライセンス アクション
JAP 本文_fulltext (198.1 kB)
Copyright (2003) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.The following article appeared in Journal of Applied Physics, 93(1), pp.101- 105 ; 2003 and may be found at http://link.aip.org/link/?jap/93/101
Item type 学術雑誌論文 / Journal Article(1)
公開日 2012-11-06
タイトル
タイトル Optical properties of nanocrystalline diamond films by prism coupling technique
言語 en
言語
言語 eng
資源タイプ
資源タイプ識別子 http://purl.org/coar/resource_type/c_6501
資源タイプ journal article
著者 Sharda, T.

× Sharda, T.

en Sharda, T.

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曾我, 哲夫

× 曾我, 哲夫

en Soga, Tetsuo

ja 曾我, 哲夫
ISNI

ja-Kana ソガ, テツオ


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Jimbo, Takashi

× Jimbo, Takashi

en Jimbo, Takashi

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著者別名
姓名 Soga, Tetsuo
言語 en
姓名 曾我, 哲夫
言語 ja
姓名 ソガ, テツオ
言語 ja-Kana
著者別名
姓名 神保, 孝志
bibliographic_information en : JOURNAL OF APPLIED PHYSICS

巻 93, 号 1, p. 101-105, 発行日 2003-01-01
出版者
出版者 American Institute of Physics
言語 en
ISSN
収録物識別子タイプ ISSN
収録物識別子 0021-8979
item_10001_source_id_32
収録物識別子タイプ NCID
収録物識別子 AA00693547
出版タイプ
出版タイプ VoR
出版タイプResource http://purl.org/coar/version/c_970fb48d4fbd8a85
item_10001_relation_34
関連タイプ isIdenticalTo
識別子タイプ DOI
関連識別子 http://dx.doi.org/10.1063/1.1524719
関連名称 10.1063/1.1524719
内容記述
内容記述タイプ Other
内容記述 Measurement of optical properties such as the refractive index and thickness of nanocrystalline or smooth diamond films is carried out by the prism coupling technique. The films observed to be absorbing for a standard operating wavelength of 633 nm and higher wavelengths, i.e., 830 and 1300 nm, were used to obtain sharp guided modes and the refractive index and thickness of the films could be measured independently with high accuracy. The index of the nanocrystalline diamond films was found to be homogeneous within the films with negligible changes observed at the film-substrate interface. Information on absorption was also obtained from the half width of the guided modes and was correlated to the graphitic concentration of the films measured by Raman spectroscopy. The thickness measured by the prism coupling technique was found to be in agreement with the thickness measured by cross-sectional transmission electron microscopy. The overall results indicate that the prism coupling technique can be very useful for rapid, easy accurate measurement of the refractive index and thickness of smooth diamond films.
言語 en
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