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Sequential tunneling model of field emission through dielectric deposits on nanotips
https://nitech.repo.nii.ac.jp/records/5151
https://nitech.repo.nii.ac.jp/records/5151af98ec7d-9381-4de4-9d54-d02df47c7653
名前 / ファイル | ライセンス | アクション |
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本文_fulltext (109.3 kB)
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Copyright(2003) American Vacuum Society. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Vacuum Society.The following article appeared in Journal of Vacuum Science a Technology B, 21(4),pp.1692-1699 ; 2003 and may be found at http://link.aip.org/link/?jvb/21/1692.
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Item type | 学術雑誌論文 / Journal Article(1) | |||||
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公開日 | 2012-11-06 | |||||
タイトル | ||||||
言語 | en | |||||
タイトル | Sequential tunneling model of field emission through dielectric deposits on nanotips | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
著者 |
Filip, V.
× Filip, V.× Nicolaescu, D.× Tanemura, Masaki× Okuyama, F. |
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著者別名 | ||||||
姓名 | 種村, 眞幸 | |||||
書誌情報 |
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures 巻 21, 号 4, p. 1692-1699, 発行日 2003-07-31 |
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出版者 | ||||||
出版者 | American Vacuum Society | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 10711023 | |||||
書誌レコードID(NCID) | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AA10804928 | |||||
著者版フラグ | ||||||
出版タイプ | VoR | |||||
出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||
DOI | ||||||
関連タイプ | isIdenticalTo | |||||
識別子タイプ | DOI | |||||
関連識別子 | http://dx.doi.org/10.1116/1.1596222 | |||||
関連名称 | 10.1116/1.1596222 | |||||
内容記述 | ||||||
内容記述タイプ | Other | |||||
内容記述 | A model of sequential (incoherent) tunneling for the electron field emission was built up in order to explain some peculiarities of the electronic emission from relatively thick dielectric layers covering nanometer-range tips, particularly carbon nanotubes. The emission current as a function of applied voltage, dielectric layer thickness, polarizability, and temperature was computed. Various experimentally detected trends were thereby modeled, leading to the conclusion that incoherent tunneling might be a competitive mechanism for electron field emission from dielectric layers on the tips of nanometer-sized cathodes. | |||||
フォーマット | ||||||
内容記述タイプ | Other | |||||
内容記述 | application/pdf |