WEKO3
アイテム
{"_buckets": {"deposit": "49bd0bae-1f14-4e94-becb-ca58d7a2adca"}, "_deposit": {"created_by": 3, "id": "6196", "owners": [3], "pid": {"revision_id": 0, "type": "depid", "value": "6196"}, "status": "published"}, "_oai": {"id": "oai:nitech.repo.nii.ac.jp:00006196", "sets": ["623"]}, "author_link": ["5755"], "item_9_biblio_info_5": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2004-03-31", "bibliographicIssueDateType": "Issued"}, "bibliographicPageEnd": "149", "bibliographicPageStart": "145", "bibliographicVolumeNumber": "55", "bibliographic_titles": [{"bibliographic_title": "名古屋工業大学紀要"}]}]}, "item_9_description_10": {"attribute_name": "内容記述", "attribute_value_mlt": [{"subitem_description": "The data check on the Tc of Kl type superconductor was made by making use of analogue to digital converter for the measurements of low temperature and voltage as we can see in the bulletin of N.I.T published in March 2002. Here, the accuracies of these measurements are greatly influenced by putting the applicable items into the designated lines of sensorial files as a matter of fact. So what I suggest is to check up again on the binary files of converting analogue to digital system to gain the confidence in such measurements. This paper deals mainly with the low temperature measurements below the room one and the measurements of the output of voltage less than 5(v) referring to the previous installment.", "subitem_description_type": "Other"}]}, "item_9_description_11": {"attribute_name": "フォーマット", "attribute_value_mlt": [{"subitem_description": "application/pdf", "subitem_description_type": "Other"}]}, "item_9_full_name_4": {"attribute_name": "著者別名", "attribute_value_mlt": [{"nameIdentifiers": [{"nameIdentifier": "5755", "nameIdentifierScheme": "WEKO"}], "names": [{"name": "杉本, 光毅"}]}]}, "item_9_link_14": {"attribute_name": "論文ID(NAID)", "attribute_value_mlt": [{"subitem_link_text": "110004087044", "subitem_link_url": "https://ci.nii.ac.jp/naid/110004087044"}]}, "item_9_publisher_6": {"attribute_name": "出版者", "attribute_value_mlt": [{"subitem_publisher": "名古屋工業大学"}]}, "item_9_source_id_7": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "0918595X", "subitem_source_identifier_type": "ISSN"}]}, "item_9_source_id_8": {"attribute_name": "書誌レコードID", "attribute_value_mlt": [{"subitem_source_identifier": "AN10389180", "subitem_source_identifier_type": "NCID"}]}, "item_9_version_type_9": {"attribute_name": "著者版フラグ", "attribute_value_mlt": [{"subitem_version_resource": "http://purl.org/coar/version/c_970fb48d4fbd8a85", "subitem_version_type": "VoR"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Sugimoto, Kouki", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "5755", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2018-02-13"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "bnit2004_145.pdf", "filesize": [{"value": "541.3 kB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_free", "mimetype": "application/pdf", "size": 541300.0, "url": {"label": "本文_fulltext", "url": "https://nitech.repo.nii.ac.jp/record/6196/files/bnit2004_145.pdf"}, "version_id": "9f534e1c-4e1e-4a91-9cde-8089429b1c20"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "departmental bulletin paper", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "The Data Check on the Tc of Kl Type Superconductor(II)", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "The Data Check on the Tc of Kl Type Superconductor(II)", "subitem_title_language": "en"}]}, "item_type_id": "9", "owner": "3", "path": ["623"], "permalink_uri": "https://nitech.repo.nii.ac.jp/records/6196", "pubdate": {"attribute_name": "公開日", "attribute_value": "2018-02-13"}, "publish_date": "2018-02-13", "publish_status": "0", "recid": "6196", "relation": {}, "relation_version_is_last": true, "title": ["The Data Check on the Tc of Kl Type Superconductor(II)"], "weko_shared_id": 3}
The Data Check on the Tc of Kl Type Superconductor(II)
https://nitech.repo.nii.ac.jp/records/6196
https://nitech.repo.nii.ac.jp/records/61961dba725a-7197-4bea-be39-abbfd7994d42
名前 / ファイル | ライセンス | アクション |
---|---|---|
本文_fulltext (541.3 kB)
|
|
Item type | 紀要論文 / Departmental Bulletin Paper_04(1) | |||||
---|---|---|---|---|---|---|
公開日 | 2018-02-13 | |||||
タイトル | ||||||
言語 | en | |||||
タイトル | The Data Check on the Tc of Kl Type Superconductor(II) | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | departmental bulletin paper | |||||
著者 |
Sugimoto, Kouki
× Sugimoto, Kouki |
|||||
著者別名 | ||||||
姓名 | 杉本, 光毅 | |||||
書誌情報 |
名古屋工業大学紀要 巻 55, p. 145-149, 発行日 2004-03-31 |
|||||
出版者 | ||||||
出版者 | 名古屋工業大学 | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 0918595X | |||||
書誌レコードID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AN10389180 | |||||
著者版フラグ | ||||||
出版タイプ | VoR | |||||
出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||
論文ID(NAID) | ||||||
110004087044 | ||||||
https://ci.nii.ac.jp/naid/110004087044 | ||||||
内容記述 | ||||||
内容記述タイプ | Other | |||||
内容記述 | The data check on the Tc of Kl type superconductor was made by making use of analogue to digital converter for the measurements of low temperature and voltage as we can see in the bulletin of N.I.T published in March 2002. Here, the accuracies of these measurements are greatly influenced by putting the applicable items into the designated lines of sensorial files as a matter of fact. So what I suggest is to check up again on the binary files of converting analogue to digital system to gain the confidence in such measurements. This paper deals mainly with the low temperature measurements below the room one and the measurements of the output of voltage less than 5(v) referring to the previous installment. | |||||
フォーマット | ||||||
内容記述タイプ | Other | |||||
内容記述 | application/pdf |