@article{oai:nitech.repo.nii.ac.jp:00002229,
 author = {王, 俊 and 日比野, 寿 and 石澤, 伸夫},
 journal = {セラミックス基盤工学研究センター年報 = Annual report of the Ceramics Research Laboratory Nagoya Institute of Technology},
 month = {Mar},
 note = {Temperature of the hot-gas crystal heater installed on the high-temperature single-crystal diffractometer with a charge-coupleddevice type area detector has been calibrated, and the temperature distribution around the crystal position has been examined. Taskswere accomplished by (1) the observation of melting of metal samples, and (2) the use of a fine-gage thermocouple. Bothexperiments indicated that the actual temperature (tcryst) at the crystal position on the diffractometer was slightly higher than thesetting temperature (tset) of the crystal heater and their difference (Dt) increased with increasing temperature: for example, Dt was7 ℃ at 300 ℃, 18 ℃ at 600 ℃, and 30 ℃ at 900 ℃. A conversion table from tset to tcryst is presented using a cubic polynomial., application/pdf},
 pages = {43--47},
 title = {高温単結晶Ｘ線回析計の温度検定},
 volume = {10},
 year = {2011},
 yomi = {ヒビノ, ヒサシ and イシザワ, ノブオ}
}