{"created":"2023-05-15T12:34:05.195647+00:00","id":2229,"links":{},"metadata":{"_buckets":{"deposit":"56aba75a-2878-425a-844d-03461cedd2a8"},"_deposit":{"created_by":3,"id":"2229","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"2229"},"status":"published"},"_oai":{"id":"oai:nitech.repo.nii.ac.jp:00002229","sets":["399:401"]},"author_link":["6214","6213","6209"],"item_9_alternative_title_1":{"attribute_name":"その他（別言語等）のタイトル","attribute_value_mlt":[{"subitem_alternative_title":"コウオン　タンケッショウ　Ｘセン　カイセキケイ　ノ　オンド　ケンテイ"},{"subitem_alternative_title":"Temperature Calibration of the High-Temperature Single-Crystal X-Ray Diffractometer"}]},"item_9_biblio_info_5":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2011-03-31","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"47","bibliographicPageStart":"43","bibliographicVolumeNumber":"10","bibliographic_titles":[{"bibliographic_title":"セラミックス基盤工学研究センター年報 = Annual report of the Ceramics Research Laboratory Nagoya Institute of Technology"}]}]},"item_9_description_10":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"Temperature of the hot-gas crystal heater installed on the high-temperature single-crystal diffractometer with a charge-coupleddevice type area detector has been calibrated, and the temperature distribution around the crystal position has been examined. Taskswere accomplished by (1) the observation of melting of metal samples, and (2) the use of a fine-gage thermocouple. Bothexperiments indicated that the actual temperature (tcryst) at the crystal position on the diffractometer was slightly higher than thesetting temperature (tset) of the crystal heater and their difference (Dt) increased with increasing temperature: for example, Dt was7 ℃ at 300 ℃, 18 ℃ at 600 ℃, and 30 ℃ at 900 ℃. A conversion table from tset to tcryst is presented using a cubic polynomial.","subitem_description_type":"Other"}]},"item_9_description_11":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_9_full_name_4":{"attribute_name":"著者別名","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"6213","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Wang, Jun"}]},{"nameIdentifiers":[{"nameIdentifier":"6214","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Hibino, Hisashi"}]},{"nameIdentifiers":[{"nameIdentifier":"6209","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Ishizawa, Nobuo"}]}]},"item_9_heading_13":{"attribute_name":"見出し","attribute_value_mlt":[{"subitem_heading_banner_headline":"<技術レポート>","subitem_heading_language":"ja"},{"subitem_heading_banner_headline":"<Technical Report>","subitem_heading_language":"en"}]},"item_9_publisher_6":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"名古屋工業大学セラミックス基盤工学研究センター"}]},"item_9_source_id_7":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"13471694","subitem_source_identifier_type":"ISSN"}]},"item_9_source_id_8":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11625130","subitem_source_identifier_type":"NCID"}]},"item_9_version_type_9":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"王, 俊"},{"creatorName":"ヒビノ, ヒサシ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"日比野, 寿"},{"creatorName":"イシザワ, ノブオ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"石澤, 伸夫"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2016-12-07"}],"displaytype":"detail","filename":"arnit2010_43-47.pdf","filesize":[{"value":"1.5 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"本文_fulltext","url":"https://nitech.repo.nii.ac.jp/record/2229/files/arnit2010_43-47.pdf"},"version_id":"80f80ce2-1d46-4cd9-a0fe-5b91d2b5e855"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"高温単結晶Ｘ線回析計の温度検定","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"高温単結晶Ｘ線回析計の温度検定"}]},"item_type_id":"9","owner":"3","path":["401"],"pubdate":{"attribute_name":"公開日","attribute_value":"2011-08-11"},"publish_date":"2011-08-11","publish_status":"0","recid":"2229","relation_version_is_last":true,"title":["高温単結晶Ｘ線回析計の温度検定"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2023-05-16T15:25:59.389080+00:00"}