@article{oai:nitech.repo.nii.ac.jp:00002259,
 author = {井田, 隆 and Ida, Takashi and 大矢, 哲久 and 日比野, 寿},
 journal = {セラミックス基盤工学研究センター年報 = Annual report of the Ceramics Research Laboratory Nagoya Institute of Technology},
 month = {Mar},
 note = {Statistical variance of x-ray intensity affected by counting loss of detection systems has been experimentally evaluated by a repeatedChipman’s foil method for a laboratory powder x-ray diffractometer and a high-resolution synchrotron powder diffractometer. Theeffects of counting loss were modeled by an intermediately extended dead-time model. It has been found that the statistical varianceis satisfactorily reproduced applying the parameters evaluated by least-squares analyses on the data measured by a single-shot Chipman’smethod. It means that the statistical errors attached to the observed intensity data can appropriately be predicted from the resultsof a rapid calibration measurement., application/pdf},
 pages = {1--5},
 title = {検出システムの数え落しの影響を受けた観測強度データの統計的な性質},
 volume = {7},
 year = {2008},
 yomi = {イダ, タカシ and オオヤ, アキヒサ and ヒビノ, ヒサシ}
}