{"created":"2023-05-15T12:34:06.436477+00:00","id":2259,"links":{},"metadata":{"_buckets":{"deposit":"7926697d-dc9b-4c77-96c1-f66ef9bc22ab"},"_deposit":{"created_by":3,"id":"2259","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"2259"},"status":"published"},"_oai":{"id":"oai:nitech.repo.nii.ac.jp:00002259","sets":["399:404"]},"author_link":["6214","6278","12","6275"],"item_9_alternative_title_1":{"attribute_name":"その他（別言語等）のタイトル","attribute_value_mlt":[{"subitem_alternative_title":"ケンシュツ　システム　ノ　カゾエ　オトシ　ノ　エイキョウ　オ　ウケタ　カンソク　キョウド　データ　ノ　トウケイテキ　ナ　セイシツ"},{"subitem_alternative_title":"Statistical Properties of Measured Intensity Affected by Counting Losses of Detection Systems"}]},"item_9_biblio_info_5":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2008-03-31","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"5","bibliographicPageStart":"1","bibliographicVolumeNumber":"7","bibliographic_titles":[{"bibliographic_title":"セラミックス基盤工学研究センター年報 = Annual report of the Ceramics Research Laboratory Nagoya Institute of Technology"}]}]},"item_9_description_10":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"Statistical variance of x-ray intensity affected by counting loss of detection systems has been experimentally evaluated by a repeatedChipman’s foil method for a laboratory powder x-ray diffractometer and a high-resolution synchrotron powder diffractometer. Theeffects of counting loss were modeled by an intermediately extended dead-time model. It has been found that the statistical varianceis satisfactorily reproduced applying the parameters evaluated by least-squares analyses on the data measured by a single-shot Chipman’smethod. It means that the statistical errors attached to the observed intensity data can appropriately be predicted from the resultsof a rapid calibration measurement.","subitem_description_type":"Other"}]},"item_9_description_11":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_9_full_name_4":{"attribute_name":"著者別名","attribute_value_mlt":[{"affiliations":[{"affiliationNames":[{"affiliationName":"","lang":"ja"}],"nameIdentifiers":[{"nameIdentifier":"","nameIdentifierScheme":"ISNI","nameIdentifierURI":"http://www.isni.org/isni/"}]}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{"nameIdentifier":"12","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"1000080232388","nameIdentifierScheme":"NRID","nameIdentifierURI":"http://rns.nii.ac.jp/nr/1000080232388"}],"names":[{"name":"井田, 隆","nameLang":"ja"},{"name":"イダ, タカシ","nameLang":"ja-Kana"},{"name":"Ida, Takashi","nameLang":"en"}]},{"nameIdentifiers":[{"nameIdentifier":"6278","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Oya, Akihisa"}]},{"nameIdentifiers":[{"nameIdentifier":"6214","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Hibino, Hisashi"}]}]},"item_9_heading_13":{"attribute_name":"見出し","attribute_value_mlt":[{"subitem_heading_banner_headline":"<論文>","subitem_heading_language":"ja"},{"subitem_heading_banner_headline":"<Paper>","subitem_heading_language":"en"}]},"item_9_publisher_6":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"名古屋工業大学セラミックス基盤工学研究センター"}]},"item_9_source_id_7":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"13471694","subitem_source_identifier_type":"ISSN"}]},"item_9_source_id_8":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11625130","subitem_source_identifier_type":"NCID"}]},"item_9_version_type_9":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":""}],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"井田, 隆","creatorNameLang":"ja"},{"creatorName":"イダ, タカシ","creatorNameLang":"ja-Kana"},{"creatorName":"Ida, Takashi","creatorNameLang":"en"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{}]},{"creatorNames":[{"creatorName":"大矢, 哲久"},{"creatorName":"オオヤ, アキヒサ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"日比野, 寿"},{"creatorName":"ヒビノ, ヒサシ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2016-12-07"}],"displaytype":"detail","filename":"arnit2007_1-5.pdf","filesize":[{"value":"947.3 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"本文_fulltext","url":"https://nitech.repo.nii.ac.jp/record/2259/files/arnit2007_1-5.pdf"},"version_id":"dab8f08e-42df-4fe0-b0d7-637174562609"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"検出システムの数え落しの影響を受けた観測強度データの統計的な性質","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"検出システムの数え落しの影響を受けた観測強度データの統計的な性質"}]},"item_type_id":"9","owner":"3","path":["404"],"pubdate":{"attribute_name":"公開日","attribute_value":"2011-08-10"},"publish_date":"2011-08-10","publish_status":"0","recid":"2259","relation_version_is_last":true,"title":["検出システムの数え落しの影響を受けた観測強度データの統計的な性質"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2024-01-31T04:35:38.635782+00:00"}