{"created":"2023-05-15T12:34:09.670226+00:00","id":2328,"links":{},"metadata":{"_buckets":{"deposit":"5dbe2c0c-c0cf-4a45-bc84-1d24066012f3"},"_deposit":{"created_by":91,"id":"2328","owners":[91],"pid":{"revision_id":0,"type":"depid","value":"2328"},"status":"published"},"_oai":{"id":"oai:nitech.repo.nii.ac.jp:00002328","sets":["399:410"]},"author_link":["12","6510"],"item_9_biblio_info_5":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2002-03-31","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"29","bibliographicPageStart":"23","bibliographicVolumeNumber":"1","bibliographic_titles":[{"bibliographic_title":"セラミックス基盤工学研究センター年報","bibliographic_titleLang":"ja"},{"bibliographic_title":"Annual report of the Ceramics Research Laboratory Nagoya Institute of Technology","bibliographic_titleLang":"en"}]}]},"item_9_description_10":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"Experimental peak profiles measured with a conventional powder X-ray diffractometer are approximated by convolutions of the intrinsic diffraction profiles with various kinds of aberrations of the instruments. A new method to remove the effects of the aberrations from the experimental data has been developed. The method is based on the deconvolution by Fourier method combined with scale transformation and interpolation of data. The effects of axial divergence, flat specimen, sample transparency and spectroscopic profile of the source X-ray are eliminated from the entire diffraction pattern in three-step operations. The peak profiles in the deconvoluted data are well modeled by symmetrical functions. The errors in the deconvoluted data propagated from the statistical errors in the source data are also discussed.","subitem_description_language":"en","subitem_description_type":"Other"}]},"item_9_heading_13":{"attribute_name":"見出し","attribute_value_mlt":[{"subitem_heading_banner_headline":"<論文>","subitem_heading_language":"ja"},{"subitem_heading_banner_headline":"<Papers>","subitem_heading_language":"en"}]},"item_9_publisher_6":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"名古屋工業大学セラミックス基盤工学研究センター","subitem_publisher_language":"ja"}]},"item_9_source_id_7":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1347-1694","subitem_source_identifier_type":"PISSN"}]},"item_9_source_id_8":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11625130","subitem_source_identifier_type":"NCID"}]},"item_9_version_type_9":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifierScheme":"ISNI","affiliationNameIdentifierURI":"http://www.isni.org/isni/"}],"affiliationNames":[{"affiliationNameLang":"ja"}]}],"creatorNames":[{"creatorName":"井田, 隆","creatorNameLang":"ja"},{"creatorName":"イダ, タカシ","creatorNameLang":"ja-Kana"},{"creatorName":"Ida, Takashi","creatorNameLang":"en"}],"familyNames":[{"familyName":"井田","familyNameLang":"ja"},{"familyName":"イダ","familyNameLang":"ja-Kana"},{"familyName":"Ida","familyNameLang":"en"}],"givenNames":[{"givenName":"隆","givenNameLang":"ja"},{"givenName":"タカシ","givenNameLang":"ja-Kana"},{"givenName":"Takashi","givenNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"12","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"1000080232388","nameIdentifierScheme":"NRID","nameIdentifierURI":"http://rns.nii.ac.jp/nr/1000080232388"}]},{"creatorNames":[{"creatorName":"虎谷, 秀穂","creatorNameLang":"ja"},{"creatorName":"トラヤ, ヒデオ","creatorNameLang":"ja-Kana"},{"creatorName":"Toraya, Hideo","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"6510","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2016-12-07"}],"displaytype":"detail","filename":"arnit2001_23.pdf","filesize":[{"value":"3.5 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"本文_fulltext","objectType":"fulltext","url":"https://nitech.repo.nii.ac.jp/record/2328/files/arnit2001_23.pdf"},"version_id":"11637a11-6166-4bf4-834f-5c1061fc1fc1"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"粉末X線回折パターンからのKα2線と装置収差の影響の除去","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"粉末X線回折パターンからのKα2線と装置収差の影響の除去","subitem_title_language":"ja"},{"subitem_title":"フンマツ　Xセン　カイセキ　パターン　カラノ　Ka２セン　ト　ソウチ　シュウサ　ノ　エイキョウ　ノ　ジョキョ","subitem_title_language":"ja-Kana"},{"subitem_title":"Elimination of Kα2 Lines and Effects of Instrumental Aberrations from  Powder X-ray Diffraction Pattern","subitem_title_language":"en"}]},"item_type_id":"9","owner":"91","path":["410"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2011-08-01"},"publish_date":"2011-08-01","publish_status":"0","recid":"2328","relation_version_is_last":true,"title":["粉末X線回折パターンからのKα2線と装置収差の影響の除去"],"weko_creator_id":"91","weko_shared_id":-1},"updated":"2024-11-28T04:57:28.172145+00:00"}