{"created":"2023-05-15T12:34:31.924455+00:00","id":3147,"links":{},"metadata":{"_buckets":{"deposit":"645be6e9-f52c-425d-8cef-ca0f79475bbd"},"_deposit":{"created_by":16,"id":"3147","owners":[16],"pid":{"revision_id":0,"type":"depid","value":"3147"},"status":"published"},"_oai":{"id":"oai:nitech.repo.nii.ac.jp:00003147","sets":["509:510:514","509:512:542"]},"author_link":["8092","8092"],"item_2_alternative_title_1":{"attribute_name":"その他（別言語等）のタイトル","attribute_value_mlt":[{"subitem_alternative_title":"酸化物半導体(SnO2,Ga-O,Fe-O)薄膜の電気化学堆積と評価","subitem_alternative_title_language":"ja"}]},"item_2_date_granted_8":{"attribute_name":"学位授与年月日","attribute_value_mlt":[{"subitem_dategranted":"2014-03-23"}]},"item_2_degree_grantor_10":{"attribute_name":"学位授与機関","attribute_value_mlt":[{"subitem_degreegrantor":[{"subitem_degreegrantor_language":"ja","subitem_degreegrantor_name":"名古屋工業大学"}],"subitem_degreegrantor_identifier":[{"subitem_degreegrantor_identifier_name":"13903","subitem_degreegrantor_identifier_scheme":"kakenhi"}]}]},"item_2_degree_name_6":{"attribute_name":"学位名","attribute_value_mlt":[{"subitem_degreename":"博士(工学)","subitem_degreename_language":"ja"},{"subitem_degreename":"Doctor of Engineering","subitem_degreename_language":"en"}]},"item_2_description_11":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"主査：市村　正也","subitem_description_language":"ja","subitem_description_type":"Other"}]},"item_2_dissertation_number_7":{"attribute_name":"学位授与番号","attribute_value_mlt":[{"subitem_dissertationnumber":"甲第928号"}]},"item_2_full_name_15":{"attribute_name":"著者別名","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"8092","nameIdentifierScheme":"WEKO"}],"names":[{"name":"ビッキーゾ, ジュニ　ジョン　マグダダロ","nameLang":"ja"}]}]},"item_2_identifier_registration":{"attribute_name":"ID登録","attribute_value_mlt":[{"subitem_identifier_reg_text":"10.20602/00003141","subitem_identifier_reg_type":"JaLC"}]},"item_2_version_type_9":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"open access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_abf2"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Vequizo, Junie Jhon Magdadaro","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2016-12-27"}],"displaytype":"detail","filename":"ko0928_a.pdf","filesize":[{"value":"4.1 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"要旨_abstract_review","objectType":"abstract","url":"https://nitech.repo.nii.ac.jp/record/3147/files/ko0928_a.pdf"},"version_id":"4ba6a82a-bc1e-44de-bbb1-48a4f2f13d28"},{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2016-12-27"}],"displaytype":"detail","filename":"ko0928_f.pdf","filesize":[{"value":"6.8 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"本文_fulltext","objectType":"fulltext","url":"https://nitech.repo.nii.ac.jp/record/3147/files/ko0928_f.pdf"},"version_id":"26b6b7a0-1a34-4650-8b5e-5df692bbf89c"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"doctoral thesis","resourceuri":"http://purl.org/coar/resource_type/c_db06"}]},"item_title":"Electrodeposition and Characterization of Oxide Semiconductors (SnO2,Ga-O,and Fe-O) Thin Films","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Electrodeposition and Characterization of Oxide Semiconductors (SnO2,Ga-O,and Fe-O) Thin Films","subitem_title_language":"en"}]},"item_type_id":"2","owner":"16","path":["514","542"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2014-07-31"},"publish_date":"2014-07-31","publish_status":"0","recid":"3147","relation_version_is_last":true,"title":["Electrodeposition and Characterization of Oxide Semiconductors (SnO2,Ga-O,and Fe-O) Thin Films"],"weko_creator_id":"16","weko_shared_id":-1},"updated":"2024-02-22T07:44:31.363656+00:00"}