@article{oai:nitech.repo.nii.ac.jp:00004519,
 author = {Bae, Jongsuck and Okamoto, Tatsuya and Fujii, Tetsu and Mizuno, Koji and Nozokido, Tatsuo},
 issue = {24},
 journal = {APPLIED PHYSICS LETTERS},
 month = {Oct},
 note = {Scanning near-field optical microscopy using a slit-type probe is discussed. The slit-type probe has a width of much less than a wavelength, λ, and a length on the order of λ, and thus has high transmission efficiency. Two dimensional near-field images of objects have been constructed using an image reconstruction algorithm based on computerized tomographic imaging. Experiments performed at 60 GHz (λ = 5mm) show that this type of near-field microscopy can achieve a spatial resolution of better than λ/45 for two dimensional imaging. A method for fabricating a submicron width slit probe at the end of an optical fiber is presented for extending this microscopy to optical waves., application/pdf},
 pages = {3581--3583},
 title = {Experimental demonstration for scanning near-field optical microscopy using a metal micro-slit probe at millimeter wavelengths},
 volume = {71},
 year = {1997}
}