{"created":"2023-05-15T12:35:33.781677+00:00","id":4519,"links":{},"metadata":{"_buckets":{"deposit":"2f6f9a41-14c5-4a30-ab4b-308a6f76661b"},"_deposit":{"created_by":3,"id":"4519","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"4519"},"status":"published"},"_oai":{"id":"oai:nitech.repo.nii.ac.jp:00004519","sets":["31"]},"author_link":["14045","14043","13640","14042","8731"],"item_10001_biblio_info_28":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1997-10-14","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"24","bibliographicPageEnd":"3583","bibliographicPageStart":"3581","bibliographicVolumeNumber":"71","bibliographic_titles":[{"bibliographic_title":"APPLIED PHYSICS LETTERS"}]}]},"item_10001_description_36":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"Scanning near-field optical microscopy using a slit-type probe is discussed. The slit-type probe has a width of much less than a wavelength, λ, and a length on the order of λ, and thus has high transmission efficiency. Two dimensional near-field images of objects have been constructed using an image reconstruction algorithm based on computerized tomographic imaging. Experiments performed at 60 GHz (λ = 5mm) show that this type of near-field microscopy can achieve a spatial resolution of better than λ/45 for two dimensional imaging. A method for fabricating a submicron width slit probe at the end of an optical fiber is presented for extending this microscopy to optical waves.","subitem_description_type":"Other"}]},"item_10001_description_38":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_10001_full_name_27":{"attribute_name":"著者別名","attribute_value_mlt":[{"nameIdentifiers":[{},{}],"names":[{"name":"裵, 鐘石"}]}]},"item_10001_publisher_29":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"American Institute of Physics"}]},"item_10001_relation_34":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"10.1063/1.120397"}],"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"http://dx.doi.org/10.1063/1.120397","subitem_relation_type_select":"DOI"}}]},"item_10001_source_id_30":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"00036951","subitem_source_identifier_type":"ISSN"}]},"item_10001_source_id_32":{"attribute_name":"書誌レコードID（NCID）","attribute_value_mlt":[{"subitem_source_identifier":"AA00543431","subitem_source_identifier_type":"NCID"}]},"item_10001_version_type_33":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Bae, Jongsuck","creatorNameLang":"en"}],"nameIdentifiers":[{},{}]},{"creatorNames":[{"creatorName":"Okamoto, Tatsuya","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Fujii, Tetsu","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Mizuno, Koji","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Nozokido, Tatsuo","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-01-23"}],"displaytype":"detail","filename":"APL 71_3581.pdf","filesize":[{"value":"280.7 kB"}],"format":"application/pdf","license_note":"Copyright (1997) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.The following article appeared in Applied physics letters, 71(24),pp.3581-3583 ; 1997 and may be found at http://link.aip.org/link/?apl/71/3581","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"本文_fulltext","url":"https://nitech.repo.nii.ac.jp/record/4519/files/APL 71_3581.pdf"},"version_id":"c60abd70-0fa9-4be7-b52d-0b59c7694656"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Experimental demonstration for scanning near-field optical microscopy using a metal micro-slit probe at millimeter wavelengths","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Experimental demonstration for scanning near-field optical microscopy using a metal micro-slit probe at millimeter wavelengths","subitem_title_language":"en"}]},"item_type_id":"10001","owner":"3","path":["31"],"pubdate":{"attribute_name":"公開日","attribute_value":"2012-11-06"},"publish_date":"2012-11-06","publish_status":"0","recid":"4519","relation_version_is_last":true,"title":["Experimental demonstration for scanning near-field optical microscopy using a metal micro-slit probe at millimeter wavelengths"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-05-16T14:18:25.395387+00:00"}