{"created":"2023-05-15T12:35:37.147727+00:00","id":4599,"links":{},"metadata":{"_buckets":{"deposit":"6feb02a3-2601-4753-9336-2fcb98f316a1"},"_deposit":{"created_by":91,"id":"4599","owners":[91],"pid":{"revision_id":0,"type":"depid","value":"4599"},"status":"published"},"_oai":{"id":"oai:nitech.repo.nii.ac.jp:00004599","sets":["31"]},"author_link":["12","12"],"item_10001_biblio_info_28":{"attribute_name":"bibliographic_information","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1998-11","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"11","bibliographicPageEnd":"3839","bibliographicPageStart":"3837","bibliographicVolumeNumber":"69","bibliographic_titles":[{"bibliographic_title":"REVIEW OF SCIENTIFIC INSTRUMENTS","bibliographic_titleLang":"en"}]}]},"item_10001_description_36":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"An efficient method for evaluating asymmetric diffraction peak profile functions based on the convolution of the Lorentzian or Gaussian function with any asymmetric window function is proposed. When this method is applied to approximate the convolution with the Howard’s window function [J. Appl. Crystallogr. 15, 615 (1982)], only a few terms of numerical integration give satisfactory results, even if the asymmetry is very strong.","subitem_description_language":"en","subitem_description_type":"Other"}]},"item_10001_full_name_27":{"attribute_name":"著者別名","attribute_value_mlt":[{"familyNames":[{"familyName":"井田","familyNameLang":"ja"},{"familyName":"イダ","familyNameLang":"ja-Kana"},{"familyName":"Ida","familyNameLang":"en"}],"givenNames":[{"givenName":"隆","givenNameLang":"ja"},{"givenName":"タカシ","givenNameLang":"ja-Kana"},{"givenName":"Takashi","givenNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"12","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"1000080232388","nameIdentifierScheme":"NRID","nameIdentifierURI":"http://rns.nii.ac.jp/nr/1000080232388"}],"names":[{"name":"井田, 隆","nameLang":"ja"},{"name":"イダ, タカシ","nameLang":"ja-Kana"},{"name":"Ida, Takashi","nameLang":"en"}]}]},"item_10001_publisher_29":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"American Institute of Physics","subitem_publisher_language":"en"}]},"item_10001_source_id_30":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0034-6748","subitem_source_identifier_type":"ISSN"}]},"item_10001_source_id_32":{"attribute_name":"item_10001_source_id_32","attribute_value_mlt":[{"subitem_source_identifier":"AA00817730","subitem_source_identifier_type":"NCID"}]},"item_10001_version_type_33":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifierScheme":"ISNI","affiliationNameIdentifierURI":"http://www.isni.org/isni/"}],"affiliationNames":[{"affiliationNameLang":"ja"}]}],"creatorNames":[{"creatorName":"井田, 隆","creatorNameLang":"ja"},{"creatorName":"イダ, タカシ","creatorNameLang":"ja-Kana"},{"creatorName":"Ida, Takashi","creatorNameLang":"en"}],"familyNames":[{"familyName":"井田","familyNameLang":"ja"},{"familyName":"イダ","familyNameLang":"ja-Kana"},{"familyName":"Ida","familyNameLang":"en"}],"givenNames":[{"givenName":"隆","givenNameLang":"ja"},{"givenName":"タカシ","givenNameLang":"ja-Kana"},{"givenName":"Takashi","givenNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"12","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"1000080232388","nameIdentifierScheme":"NRID","nameIdentifierURI":"http://rns.nii.ac.jp/nr/1000080232388"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-01-23"}],"displaytype":"detail","filename":"RSI 69_3837.pdf","filesize":[{"value":"113.3 kB"}],"format":"application/pdf","license_note":"Copyright (1998) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.The following article appeared in Review of Scientific Instruments, 69(11), pp.3837- 3839 ; 1998 and may be found at http://link.aip.org/link/?rsi/69/3837","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"本文_fulltext","url":"https://nitech.repo.nii.ac.jp/record/4599/files/RSI 69_3837.pdf"},"version_id":"45ffec83-52a6-4391-a39d-1216cf3547a1"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"item_resource_type","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"An efficient method for calculating asymmetric diffraction peak profiles","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"An efficient method for calculating asymmetric diffraction peak profiles","subitem_title_language":"en"}]},"item_type_id":"10001","owner":"91","path":["31"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2012-11-06"},"publish_date":"2012-11-06","publish_status":"0","recid":"4599","relation_version_is_last":true,"title":["An efficient method for calculating asymmetric diffraction peak profiles"],"weko_creator_id":"91","weko_shared_id":-1},"updated":"2025-03-14T05:52:44.065576+00:00"}