{"created":"2023-05-15T12:35:44.257284+00:00","id":4770,"links":{},"metadata":{"_buckets":{"deposit":"b954a759-82da-4b51-8b6e-a34c2107fcd0"},"_deposit":{"created_by":91,"id":"4770","owners":[91],"pid":{"revision_id":0,"type":"depid","value":"4770"},"status":"published"},"_oai":{"id":"oai:nitech.repo.nii.ac.jp:00004770","sets":["31"]},"author_link":["573","8753","573","8753","15362","15363"],"item_10001_alternative_title_24":{"attribute_name":"その他(別言語等)のタイトル","attribute_value_mlt":[{"subitem_alternative_title":"ケイタイ デンワ ノ デンジカイ ニヨル トウブナイ ノ ホットスポット ケイセイ ト SAR ノ FDTD  カイセキ","subitem_alternative_title_language":"ja-Kana"},{"subitem_alternative_title":"FDTD Analysis for Formulation of Hot Spot and SAR in Human Head Exposed to Electromagnetic Fields by Portable Telephone","subitem_alternative_title_language":"en"}]},"item_10001_biblio_info_28":{"attribute_name":"bibliographic_information","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2000-01-20","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"1","bibliographicPageEnd":"87","bibliographicPageStart":"81","bibliographicVolumeNumber":"J83-B","bibliographic_titles":[{"bibliographic_title":"電子情報通信学会論文誌. B, 通信","bibliographic_titleLang":"ja"}]}]},"item_10001_description_36":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"本論文では,携帯電話によるホットスポット形成の有無を明らかにするために,筆者らの製作になる成人,小児,幼児サイズの3種類の 実形状不均質頭部モデル(以下,リアルモデルと呼ぶ)と,対照モデルとしてそれらの大きさに対応した均質球モデルを用い,携帯電話による頭部内SARを平面波曝露の場合と併せてFDTD解析した.その結果,携帯電話の実使用状態ではリアルモデルでも均質球モデルでもサイズの大小にかかわらず局所ピーク SARは表面上で生じ,内部にはホットスポットは形成されないことがわかった.一方,携帯電話を頭部から9.75 cm離した状態では幼児サイズのリアルモデル及び均質球の両モデルにおいてホットスポットが現れることが判明し,このことは平面波曝露で顕著に確認できた.しかし,これらのホットスポット値は,携帯電話の実使用状態で頭部表面上に生ずるピークSAR値に比して十分小さく,例えば幼児サイズの首まで含めたリアルモデルでのホットスポット値は 900 MHzでは1 g平均で 41%以下,10 g平均では 36%以下,1.5 GHzでは1 g平均で 16%以下,10 g平均では 11%以下,であることがわかった.","subitem_description_language":"ja","subitem_description_type":"Other"}]},"item_10001_full_name_27":{"attribute_name":"著者別名","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"573","nameIdentifierScheme":"WEKO"}],"names":[{"name":"Fujiwara, Osamu"}]},{"familyNames":[{"familyName":"Wang","familyNameLang":"en"},{"familyName":"王","familyNameLang":"ja"},{"familyName":"オウ","familyNameLang":"ja-Kana"}],"givenNames":[{"givenName":"Jianqing","givenNameLang":"en"},{"givenName":"建青","givenNameLang":"ja"},{"givenName":"ケンセイ","givenNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"8753","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"1000070250694","nameIdentifierScheme":"NRID","nameIdentifierURI":"http://rns.nii.ac.jp/nr/1000070250694"}],"names":[{"name":"Wang, Jianqing","nameLang":"en"},{"name":"王, 建青","nameLang":"ja"},{"name":"オウ, ケンセイ","nameLang":"ja-Kana"}]}]},"item_10001_publisher_29":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"Institute of Electronics, Information and Communication Engineers","subitem_publisher_language":"en"}]},"item_10001_source_id_30":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1344-4697","subitem_source_identifier_type":"ISSN"}]},"item_10001_source_id_32":{"attribute_name":"item_10001_source_id_32","attribute_value_mlt":[{"subitem_source_identifier":"AA11325909","subitem_source_identifier_type":"NCID"}]},"item_10001_version_type_33":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"藤原, 修"},{"creatorName":"フジワラ, オサム","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"573","nameIdentifierScheme":"WEKO"}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifierScheme":"ISNI","affiliationNameIdentifierURI":"http://www.isni.org/isni/"}],"affiliationNames":[{"affiliationNameLang":"ja"}]}],"creatorNames":[{"creatorName":"Wang, Jianqing","creatorNameLang":"en"},{"creatorName":"王, 建青","creatorNameLang":"ja"},{"creatorName":"オウ, ケンセイ","creatorNameLang":"ja-Kana"}],"familyNames":[{"familyName":"Wang","familyNameLang":"en"},{"familyName":"王","familyNameLang":"ja"},{"familyName":"オウ","familyNameLang":"ja-Kana"}],"givenNames":[{"givenName":"Jianqing","givenNameLang":"en"},{"givenName":"建青","givenNameLang":"ja"},{"givenName":"ケンセイ","givenNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"8753","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"1000070250694","nameIdentifierScheme":"NRID","nameIdentifierURI":"http://rns.nii.ac.jp/nr/1000070250694"}]},{"creatorNames":[{"creatorName":"牛本, 卓二"}],"nameIdentifiers":[{"nameIdentifier":"15362","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"野島, 俊雄"}],"nameIdentifiers":[{"nameIdentifier":"15363","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-01-24"}],"displaytype":"detail","filename":"J83-B_81.pdf","filesize":[{"value":"915.4 kB"}],"format":"application/pdf","license_note":"Copyright(c)2000 IEICE http://search.ieice.org/index.html","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"本文_fulltext","url":"https://nitech.repo.nii.ac.jp/record/4770/files/J83-B_81.pdf"},"version_id":"c9315c18-7248-456b-8240-15520494cb33"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"item_resource_type","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"携帯電話の電磁界による頭部内のホットスポット形成とSARの FDTD解析","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"携帯電話の電磁界による頭部内のホットスポット形成とSARの FDTD解析","subitem_title_language":"ja"}]},"item_type_id":"10001","owner":"91","path":["31"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2013-06-25"},"publish_date":"2013-06-25","publish_status":"0","recid":"4770","relation_version_is_last":true,"title":["携帯電話の電磁界による頭部内のホットスポット形成とSARの FDTD解析"],"weko_creator_id":"91","weko_shared_id":-1},"updated":"2025-03-17T06:31:58.092175+00:00"}