{"created":"2023-05-15T12:35:46.001331+00:00","id":4811,"links":{},"metadata":{"_buckets":{"deposit":"2082bdbc-cb71-4ec5-8b10-30a4e24ee355"},"_deposit":{"created_by":3,"id":"4811","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"4811"},"status":"published"},"_oai":{"id":"oai:nitech.repo.nii.ac.jp:00004811","sets":["31"]},"author_link":["15573","8583","15574","15575","15576","15571","15572"],"item_10001_biblio_info_28":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2000-04","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"4","bibliographicPageEnd":"1792","bibliographicPageStart":"1788","bibliographicVolumeNumber":"71","bibliographic_titles":[{"bibliographic_title":"REVIEW OF SCIENTIFIC INSTRUMENTS"}]}]},"item_10001_description_36":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"We developed an apparatus of differential thermal analysis (DTA) capable of simultaneous surface specific ultraviolet (UV) photoemission measurements to investigate thin-film phase transitions. The apparatus was installed in a vacuum chamber of 10-6Torr range for thermal isolation and the measurements of UV photoemission. As a sample substrate, we used a thin (10 μm) copper sheet supported by two wires for optimal thermal resistivity. The performance of the apparatus was examined using a 650-A-thick pentacontane (n-C50H102) film, which may exhibit a unique monolayer phase transition known as surface freezing. We observed two anomalies of DTA curve around the bulk melting temperature, one of which is apparently due to the bulk melting. Since the temperature dependence of the surface specific UV photoemission measurements showed corresponding changes in photoemission current, we could conclude that the other phase transition peak originates from the surface freezing effect. This demonstrates that our DTA-UV apparatus is sufficiently sensitive to examine such monolayer phase transitions.","subitem_description_type":"Other"}]},"item_10001_description_38":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_10001_full_name_27":{"attribute_name":"著者別名","attribute_value_mlt":[{"nameIdentifiers":[{},{}],"names":[{"name":"山本, 靖"}]}]},"item_10001_publisher_29":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"American Institute of Physics"}]},"item_10001_source_id_30":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"00346748","subitem_source_identifier_type":"ISSN"}]},"item_10001_source_id_32":{"attribute_name":"書誌レコードID（NCID）","attribute_value_mlt":[{"subitem_source_identifier":"AA00817730","subitem_source_identifier_type":"NCID"}]},"item_10001_version_type_33":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Yamamoto, Yasushi","creatorNameLang":"en"}],"nameIdentifiers":[{},{}]},{"creatorNames":[{"creatorName":"Enami, Toshiaki","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kuroi, Masakazu","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Matsuie, Noritaka","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Ishii, Hisao","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Seki, Kazuhiko","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Ouchi, Yukio","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-01-24"}],"displaytype":"detail","filename":"RSI 71_1788.pdf","filesize":[{"value":"112.6 kB"}],"format":"application/pdf","license_note":"Copyright (2000) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.The following article appeared in Review of Scientific Instruments, 71(4), pp.1788- 1792 ; 2000 and may be found at http://link.aip.org/link/?rsi/71/1788","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"本文_fulltext","url":"https://nitech.repo.nii.ac.jp/record/4811/files/RSI 71_1788.pdf"},"version_id":"8eac0b04-c0e3-46f0-962d-85646e5eae02"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Ultrathin-film differential-thermal-analysis apparatus with simultaneous photoemission measurements","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Ultrathin-film differential-thermal-analysis apparatus with simultaneous photoemission measurements","subitem_title_language":"en"}]},"item_type_id":"10001","owner":"3","path":["31"],"pubdate":{"attribute_name":"公開日","attribute_value":"2012-11-06"},"publish_date":"2012-11-06","publish_status":"0","recid":"4811","relation_version_is_last":true,"title":["Ultrathin-film differential-thermal-analysis apparatus with simultaneous photoemission measurements"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-05-15T14:44:54.763451+00:00"}