{"created":"2023-05-15T12:35:50.991189+00:00","id":4930,"links":{},"metadata":{"_buckets":{"deposit":"d3c1035a-0009-4506-9924-07d223b99550"},"_deposit":{"created_by":3,"id":"4930","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"4930"},"status":"published"},"_oai":{"id":"oai:nitech.repo.nii.ac.jp:00004930","sets":["31"]},"author_link":["16194","16192","16190","8700","14547","13095"],"item_10001_biblio_info_28":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2001-03-12","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"11","bibliographicPageEnd":"1537","bibliographicPageStart":"1535","bibliographicVolumeNumber":"78","bibliographic_titles":[{"bibliographic_title":"APPLIED PHYSICS LETTERS"}]}]},"item_10001_description_36":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"We deposited monodispersed Co clusters with mean diameters d = 6, 8.5, and 13 nm on quartz and microgrid substrates using a plasma-gas-condensation-type cluster beam deposition system. The cluster-cluster coalescence behavior of the Co cluster assemblies was investigated by in situ electrical conductivity measurements and ex situ transmission electron microscopy (TEM). The electrical conductivity measurement indicates that, below temperature T ? 100°C, the Co clusters with d = 8.5 nm maintain their original size as deposited at room temperature, while the cluster-cluster coalescence takes place at their interface at T>100°C. The TEM observation indicates that the morphology of the cluster distribution shows no marked change at substrate temperatures Ts<250°C. Above Ts = 300°C, the interfacial area of coalesced clusters is crystalline, and has its own orientation, different from that of two connected cluster cores.","subitem_description_type":"Other"}]},"item_10001_description_38":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_10001_full_name_27":{"attribute_name":"著者別名","attribute_value_mlt":[{"nameIdentifiers":[{},{}],"names":[{"name":"日原, 岳彦"}]},{"nameIdentifiers":[{}],"names":[{"name":"隅山, 兼治"}]}]},"item_10001_publisher_29":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"American Institute of Physics"}]},"item_10001_relation_34":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"10.1063/1.1354158"}],"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"http://dx.doi.org/10.1063/1.1354158","subitem_relation_type_select":"DOI"}}]},"item_10001_source_id_30":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"00036951","subitem_source_identifier_type":"ISSN"}]},"item_10001_source_id_32":{"attribute_name":"書誌レコードID（NCID）","attribute_value_mlt":[{"subitem_source_identifier":"AA00543432","subitem_source_identifier_type":"NCID"}]},"item_10001_version_type_33":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Peng, D. L.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Konno, T. J.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Wako, K.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Hihara, Takehiko","creatorNameLang":"en"}],"nameIdentifiers":[{},{}]},{"creatorNames":[{"creatorName":"Sumiyama, Kenji","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-01-25"}],"displaytype":"detail","filename":"APL 78_1535.pdf","filesize":[{"value":"571.3 kB"}],"format":"application/pdf","license_note":"Copyright (2001) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.The following article appeared in Applied physics letters, 78(11), pp.1535 - 1537; 2001 and may be found at http://link.aip.org/link/?apl/78/1535","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"本文_fulltext","url":"https://nitech.repo.nii.ac.jp/record/4930/files/APL 78_1535.pdf"},"version_id":"6c67300c-6753-41e6-b53b-6579055be4d1"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Co cluster coalescence behavior observed by electrical conduction and transmission electron microscopy","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Co cluster coalescence behavior observed by electrical conduction and transmission electron microscopy","subitem_title_language":"en"}]},"item_type_id":"10001","owner":"3","path":["31"],"pubdate":{"attribute_name":"公開日","attribute_value":"2012-11-06"},"publish_date":"2012-11-06","publish_status":"0","recid":"4930","relation_version_is_last":true,"title":["Co cluster coalescence behavior observed by electrical conduction and transmission electron microscopy"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-05-15T14:38:55.030927+00:00"}