Bulk carrier lifetime measurement by the microwave reflectance photoconductivity decay method with external surface electric field

APL 80_4390

WEKO3

lat lon distance

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Field does not validate

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APL 80_4390.pdf

https://nitech.repo.nii.ac.jp/record/5063/files/APL 80_4390.pdf

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APL 80_4390.pdf (52.9 kB) sha256 0d0543fd3de4d411d91353f9da5aafc3e5a51982ff683222d2daa1c02c797c29	Copyright (2002) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.The following article appeared in Applied physics letters, 80(23),pp.4390-4392 ; 2002 and may be found at http://link.aip.org/link/?apl/80/4390

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