{"created":"2023-05-15T12:36:00.226478+00:00","id":5151,"links":{},"metadata":{"_buckets":{"deposit":"389d6465-7ac5-4c7c-a877-759fc7766fcc"},"_deposit":{"created_by":3,"id":"5151","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"5151"},"status":"published"},"_oai":{"id":"oai:nitech.repo.nii.ac.jp:00005151","sets":["31"]},"author_link":["8610","17332","16258","16261"],"item_10001_biblio_info_28":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2003-07-31","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"4","bibliographicPageEnd":"1699","bibliographicPageStart":"1692","bibliographicVolumeNumber":"21","bibliographic_titles":[{"bibliographic_title":"Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures"}]}]},"item_10001_description_36":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"A model of sequential (incoherent) tunneling for the electron field emission was built up in order to explain some peculiarities of the electronic emission from relatively thick dielectric layers covering nanometer-range tips, particularly carbon nanotubes. The emission current as a function of applied voltage, dielectric layer thickness, polarizability, and temperature was computed. Various experimentally detected trends were thereby modeled, leading to the conclusion that incoherent tunneling might be a competitive mechanism for electron field emission from dielectric layers on the tips of nanometer-sized cathodes.","subitem_description_type":"Other"}]},"item_10001_description_38":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_10001_full_name_27":{"attribute_name":"著者別名","attribute_value_mlt":[{"nameIdentifiers":[{},{}],"names":[{"name":"種村, 眞幸"}]}]},"item_10001_publisher_29":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"American Vacuum Society"}]},"item_10001_relation_34":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"10.1116/1.1596222"}],"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"http://dx.doi.org/10.1116/1.1596222","subitem_relation_type_select":"DOI"}}]},"item_10001_source_id_30":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"10711023","subitem_source_identifier_type":"ISSN"}]},"item_10001_source_id_32":{"attribute_name":"書誌レコードID（NCID）","attribute_value_mlt":[{"subitem_source_identifier":"AA10804928","subitem_source_identifier_type":"NCID"}]},"item_10001_version_type_33":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Filip, V.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Nicolaescu, D.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Tanemura, Masaki","creatorNameLang":"en"}],"nameIdentifiers":[{},{}]},{"creatorNames":[{"creatorName":"Okuyama, F.","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-01-25"}],"displaytype":"detail","filename":"JVB 21_1692.pdf","filesize":[{"value":"109.3 kB"}],"format":"application/pdf","license_note":"Copyright(2003) American Vacuum Society. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Vacuum Society.The following article appeared in Journal of Vacuum Science a Technology B, 21(4),pp.1692-1699 ; 2003 and may be found at http://link.aip.org/link/?jvb/21/1692.","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"本文_fulltext","url":"https://nitech.repo.nii.ac.jp/record/5151/files/JVB 21_1692.pdf"},"version_id":"13817c1e-052f-46a5-85df-7facb12b6a90"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Sequential tunneling model of field emission through dielectric deposits on nanotips","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Sequential tunneling model of field emission through dielectric deposits on nanotips","subitem_title_language":"en"}]},"item_type_id":"10001","owner":"3","path":["31"],"pubdate":{"attribute_name":"公開日","attribute_value":"2012-11-06"},"publish_date":"2012-11-06","publish_status":"0","recid":"5151","relation_version_is_last":true,"title":["Sequential tunneling model of field emission through dielectric deposits on nanotips"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-05-15T14:32:19.584225+00:00"}