Interface recombination velocity of silicon-on-insulator wafers measured by microwave reflectance photoconductivity decay method with electric field

APL 83_928

WEKO3

lat lon distance

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Field does not validate

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APL 83_928.pdf

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APL 83_928.pdf (172.2 kB) sha256 280e08e6a4f0c0d5a0d0c1e115b1d0eb81460347bd2eeab712eb267a2e7467fe	Copyright (2003) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.The following article appeared in Applied physics letters, 83(5),pp.928-930 ; 2003 and may be found at http://link.aip.org/link/?apl/83/928

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