{"created":"2023-05-15T12:36:02.294068+00:00","id":5200,"links":{},"metadata":{"_buckets":{"deposit":"9915edc0-7754-4a11-9593-cb4c584ceab7"},"_deposit":{"created_by":3,"id":"5200","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"5200"},"status":"published"},"_oai":{"id":"oai:nitech.repo.nii.ac.jp:00005200","sets":["31"]},"author_link":["17610","17608","13640","17609","8731"],"item_10001_biblio_info_28":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2004-06-25","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"6","bibliographicPageEnd":"149","bibliographicPageStart":"144","bibliographicVolumeNumber":"1","bibliographic_titles":[{"bibliographic_title":"IEICE Electronics Express"}]}]},"item_10001_description_36":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"An object mounting structure has been developed for use in millimeter-wave scanning near-field microscopy in order to efficiently reduce both unwanted signal fluctuations caused by surface waves within the object to be imaged and reflections from outside the object. The object mount comprises a hemispherical lens with an anti-reflection (AR) layer covering the spherical surface. An object mount for use at a millimeter-wave frequency of 60GHz has been designed and fabricated. Experiments performed at 60GHz show that signal fluctuations resulting from the above two factors can be dramatically reduced using this object mounting structure.","subitem_description_type":"Other"}]},"item_10001_description_38":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_10001_full_name_27":{"attribute_name":"著者別名","attribute_value_mlt":[{"nameIdentifiers":[{},{}],"names":[{"name":"裵, 鐘石"}]}]},"item_10001_publisher_29":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"The Institute of Electronics, Information and Communication Engineers"}]},"item_10001_relation_32":{"attribute_name":"書誌レコードID（NCID）","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"BA77039487","subitem_relation_type_select":"NCID"}}]},"item_10001_relation_34":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"10.1587/elex.1.144"}],"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"http://dx.doi.org/10.1587/elex.1.144","subitem_relation_type_select":"DOI"}}]},"item_10001_source_id_30":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"13492543","subitem_source_identifier_type":"ISSN"}]},"item_10001_version_type_33":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Nozokido, Tatsuo","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Nuimura, Shuji","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Hamano, Tetze","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Bae, Jongsuck","creatorNameLang":"en"}],"nameIdentifiers":[{},{}]},{"creatorNames":[{"creatorName":"Mizuno, Koji","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-01-25"}],"displaytype":"detail","filename":"ELEX_ 1_144.pdf","filesize":[{"value":"294.7 kB"}],"format":"application/pdf","license_note":"copyright (c) 2004 by The Institute of Electronics, Information and Communication Engineers http://search.ieice.org/index.html","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"本文_fulltext","url":"https://nitech.repo.nii.ac.jp/record/5200/files/ELEX_ 1_144.pdf"},"version_id":"9343ed67-a059-4fee-8702-b13a7ff136ab"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"A new object mounting structure for use in millimeter-wave scanning near-field microscopy","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"A new object mounting structure for use in millimeter-wave scanning near-field microscopy","subitem_title_language":"en"}]},"item_type_id":"10001","owner":"3","path":["31"],"pubdate":{"attribute_name":"公開日","attribute_value":"2012-11-06"},"publish_date":"2012-11-06","publish_status":"0","recid":"5200","relation_version_is_last":true,"title":["A new object mounting structure for use in millimeter-wave scanning near-field microscopy"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-05-15T14:30:58.885126+00:00"}