@article{oai:nitech.repo.nii.ac.jp:00005219,
 author = {Nozokido, Tatsuo and Obayashi, Tomohiro and Bae, Jongsuck and Mizuno, Koji},
 issue = {12},
 journal = {IEICE transactions on electronics},
 month = {Dec},
 note = {A resonant slit-type probe is proposed in this paper that can improve measurement sensitivity in millimeter-wave scanning near-field microscopy. The probe consists of a rectangular metal waveguide incorporating the following three sections; a straight section at the tip of the probe whose height is much smaller than the operating wavelength; a standard-height waveguide section; a quarter-wave transformer section to achieve impedance-matching between the other sections. The design procedure used for the probe is presented in detail and the performance of the fabricated resonant probe is evaluated experimentally. Experiments performed at U-band frequencies in which we reconstruct 2D images show that the sensitivity of the resonant probe is improved by more than four times compared with a conventional tapered slit-type probe. Some experimental results are compared with those obtained using the finite element method (Ansoft HFSS). Good agreement is demonstrated., application/pdf},
 pages = {2158--2163},
 title = {A Resonant Slit-Type Probe for Millimeter-Wave Scanning Near-Field Microscopy},
 volume = {E87-C},
 year = {2004}
}