{"created":"2023-05-15T12:36:03.107138+00:00","id":5219,"links":{},"metadata":{"_buckets":{"deposit":"6e061594-9094-4d9a-ae8a-6584c4c5ea36"},"_deposit":{"created_by":3,"id":"5219","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"5219"},"status":"published"},"_oai":{"id":"oai:nitech.repo.nii.ac.jp:00005219","sets":["31"]},"author_link":["13640","8731","17719","17718"],"item_10001_biblio_info_28":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2004-12-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"12","bibliographicPageEnd":"2163","bibliographicPageStart":"2158","bibliographicVolumeNumber":"E87-C","bibliographic_titles":[{"bibliographic_title":"IEICE transactions on electronics"}]}]},"item_10001_description_36":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"A resonant slit-type probe is proposed in this paper that can improve measurement sensitivity in millimeter-wave scanning near-field microscopy. The probe consists of a rectangular metal waveguide incorporating the following three sections; a straight section at the tip of the probe whose height is much smaller than the operating wavelength; a standard-height waveguide section; a quarter-wave transformer section to achieve impedance-matching between the other sections. The design procedure used for the probe is presented in detail and the performance of the fabricated resonant probe is evaluated experimentally. Experiments performed at U-band frequencies in which we reconstruct 2D images show that the sensitivity of the resonant probe is improved by more than four times compared with a conventional tapered slit-type probe. Some experimental results are compared with those obtained using the finite element method (Ansoft HFSS). Good agreement is demonstrated.","subitem_description_type":"Other"}]},"item_10001_description_38":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_10001_full_name_27":{"attribute_name":"著者別名","attribute_value_mlt":[{"nameIdentifiers":[{},{}],"names":[{"name":"裵, 鐘石"}]}]},"item_10001_publisher_29":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"Institute of Electronics, Information and Communication Engineers"}]},"item_10001_source_id_30":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"09168524","subitem_source_identifier_type":"ISSN"}]},"item_10001_source_id_32":{"attribute_name":"書誌レコードID（NCID）","attribute_value_mlt":[{"subitem_source_identifier":"AA10826283","subitem_source_identifier_type":"NCID"}]},"item_10001_version_type_33":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Nozokido, Tatsuo","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Obayashi, Tomohiro","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Bae, Jongsuck","creatorNameLang":"en"}],"nameIdentifiers":[{},{}]},{"creatorNames":[{"creatorName":"Mizuno, Koji","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-01-25"}],"displaytype":"detail","filename":"E87-C_2158.pdf","filesize":[{"value":"688.2 kB"}],"format":"application/pdf","license_note":"Copyright (c) 2004 IEICE  http://search.ieice.org/index.html","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"本文_fulltext","url":"https://nitech.repo.nii.ac.jp/record/5219/files/E87-C_2158.pdf"},"version_id":"c83c6a5f-f480-4340-9ece-f90c954a0242"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"A Resonant Slit-Type Probe for Millimeter-Wave Scanning Near-Field Microscopy","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"A Resonant Slit-Type Probe for Millimeter-Wave Scanning Near-Field Microscopy","subitem_title_language":"en"}]},"item_type_id":"10001","owner":"3","path":["31"],"pubdate":{"attribute_name":"公開日","attribute_value":"2012-11-06"},"publish_date":"2012-11-06","publish_status":"0","recid":"5219","relation_version_is_last":true,"title":["A Resonant Slit-Type Probe for Millimeter-Wave Scanning Near-Field Microscopy"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-05-15T14:30:25.142755+00:00"}