{"created":"2023-05-15T12:36:03.149017+00:00","id":5220,"links":{},"metadata":{"_buckets":{"deposit":"96a26cc9-b2df-49f7-bdfc-27b900b0c3f6"},"_deposit":{"created_by":3,"id":"5220","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"5220"},"status":"published"},"_oai":{"id":"oai:nitech.repo.nii.ac.jp:00005220","sets":["31"]},"author_link":["17728","17726","8751","16742","14933","17725"],"item_10001_biblio_info_28":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2004-12-14","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"1","bibliographicPageEnd":"014309-6","bibliographicPageStart":"014309-1","bibliographicVolumeNumber":"97","bibliographic_titles":[{"bibliographic_title":"JOURNAL OF APPLIED PHYSICS"}]}]},"item_10001_description_36":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"We fabricated nanocontact structures (typically in a range from 15×13 nm2 to 20×40 nm2) between Ni81Fe19 wires using electron-beam lithography and a lift-off process. In the magnetization reversal process for each sample, two kinds of magnetic domain walls with different magnetic configurations were trapped at the nanocontact between the two wires. The directions of the magnetization in the nanocontact were different between the two domain walls. These walls yielded different values of electric resistance and different depinning fields. The magnetization of the nanocontact suppresses or assists the magnetization rotation in the connected magnetic element through exchange interaction (exchange biasing), which causes the differences in the depinning field and dominates the magnetization process of the magnetic element.","subitem_description_type":"Other"}]},"item_10001_description_38":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_10001_full_name_27":{"attribute_name":"著者別名","attribute_value_mlt":[{"nameIdentifiers":[{},{}],"names":[{"name":"壬生, 攻"}]}]},"item_10001_publisher_29":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"American Institute of Physics"}]},"item_10001_relation_34":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"10.1063/1.1829143"}],"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"http://dx.doi.org/10.1063/1.1829143","subitem_relation_type_select":"DOI"}}]},"item_10001_source_id_30":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"00218979","subitem_source_identifier_type":"ISSN"}]},"item_10001_source_id_32":{"attribute_name":"書誌レコードID（NCID）","attribute_value_mlt":[{"subitem_source_identifier":"AA00693547","subitem_source_identifier_type":"NCID"}]},"item_10001_version_type_33":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Miyake, K.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Shigeto, K.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Yokoyama, Y.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Ono, T.","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Mibu, Ko","creatorNameLang":"en"}],"nameIdentifiers":[{},{}]},{"creatorNames":[{"creatorName":"Shinjo, T.","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-01-25"}],"displaytype":"detail","filename":"JAP 97_014309-1.pdf","filesize":[{"value":"869.0 kB"}],"format":"application/pdf","license_note":"Copyright (2004) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.The following article appeared in Journal of Applied Physics, 97(7), pp.014309-1- 014309-6 ; 2004 and may be found at http://link.aip.org/link/?jap/97/014309","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"本文_fulltext","url":"https://nitech.repo.nii.ac.jp/record/5220/files/JAP 97_014309-1.pdf"},"version_id":"ddacc309-d8a3-41ee-b688-a312b85dab73"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Exchange biasing of a Neel wall in the nanocontact between NiFe wires","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Exchange biasing of a Neel wall in the nanocontact between NiFe wires","subitem_title_language":"en"}]},"item_type_id":"10001","owner":"3","path":["31"],"pubdate":{"attribute_name":"公開日","attribute_value":"2012-11-06"},"publish_date":"2012-11-06","publish_status":"0","recid":"5220","relation_version_is_last":true,"title":["Exchange biasing of a Neel wall in the nanocontact between NiFe wires"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-05-15T14:30:18.485662+00:00"}