{"created":"2023-05-15T12:36:11.882739+00:00","id":5424,"links":{},"metadata":{"_buckets":{"deposit":"fa2c8e2f-71fe-43d6-aaaf-6066f8fe219f"},"_deposit":{"created_by":3,"id":"5424","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"5424"},"status":"published"},"_oai":{"id":"oai:nitech.repo.nii.ac.jp:00005424","sets":["31"]},"author_link":["18945","18944","573"],"item_10001_alternative_title_24":{"attribute_name":"その他（別言語等）のタイトル","attribute_value_mlt":[{"subitem_alternative_title":"スイヘイ　ケツゴウバン　ノ　カンセツ　ホウデンジ　ニタイスル　ESD　シケンホウ　ノ　キョウシヒン　ヘ　オヨボス　エイキョウ　ヒカク"},{"subitem_alternative_title":"Influence of ESD Test Methods on Equipment-Under-Test for Indirect Discharges onto Horizontal Coupling Plane"}]},"item_10001_biblio_info_28":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2009-02-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"2","bibliographicPageEnd":"505","bibliographicPageStart":"502","bibliographicVolumeNumber":"J92-B","bibliographic_titles":[{"bibliographic_title":"電子情報通信学会論文誌. B, 通信"}]}]},"item_10001_description_36":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"ESDガンを水平結合板上面に鉛直下方（旧規格）と垂直方向（新規格）とで放電させ，回路基板パターン上の誘導電圧を測定した結果，後者の方がピークは数分の一小さく，放電位置依存性も小さいことから，新旧の規格で試験結果に差異の生じる可能性が分かった．","subitem_description_type":"Other"}]},"item_10001_description_38":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_10001_full_name_27":{"attribute_name":"著者別名","attribute_value_mlt":[{"nameIdentifiers":[{}],"names":[{"name":"Fujiwara, Osamu"}]}]},"item_10001_publisher_29":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"Institute of Electronics, Information and Communication Engineers"}]},"item_10001_source_id_30":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"13444697","subitem_source_identifier_type":"ISSN"}]},"item_10001_source_id_32":{"attribute_name":"書誌レコードID（NCID）","attribute_value_mlt":[{"subitem_source_identifier":"AA11325909","subitem_source_identifier_type":"NCID"}]},"item_10001_version_type_33":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"山本, 典央"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"高, 義礼"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"藤原, 修"}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-01-25"}],"displaytype":"detail","filename":"J92-B_502.pdf","filesize":[{"value":"359.2 kB"}],"format":"application/pdf","license_note":"Copyright(c)2009 IEICE　http://search.ieice.org/index.html","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"本文_fulltext","url":"https://nitech.repo.nii.ac.jp/record/5424/files/J92-B_502.pdf"},"version_id":"cd75e32e-220d-4b64-ba45-ca90cb21674d"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"水平結合板の間接放電時に対するESD試験法の供試品へ及ぼす影響比較","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"水平結合板の間接放電時に対するESD試験法の供試品へ及ぼす影響比較"}]},"item_type_id":"10001","owner":"3","path":["31"],"pubdate":{"attribute_name":"公開日","attribute_value":"2013-06-25"},"publish_date":"2013-06-25","publish_status":"0","recid":"5424","relation_version_is_last":true,"title":["水平結合板の間接放電時に対するESD試験法の供試品へ及ぼす影響比較"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2023-05-16T14:37:09.176355+00:00"}