{"created":"2023-05-15T12:36:13.411889+00:00","id":5448,"links":{},"metadata":{"_buckets":{"deposit":"dde6e711-dc2f-438c-a651-cd9346153b8c"},"_deposit":{"created_by":91,"id":"5448","owners":[91],"pid":{"revision_id":0,"type":"depid","value":"5448"},"status":"published"},"_oai":{"id":"oai:nitech.repo.nii.ac.jp:00005448","sets":["31"]},"author_link":["573","19067","19068","19069","573"],"item_10001_biblio_info_28":{"attribute_name":"bibliographic_information","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2009-06-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"6","bibliographicPageEnd":"1968","bibliographicPageStart":"1965","bibliographicVolumeNumber":"E92-B","bibliographic_titles":[{"bibliographic_title":"IEICE Transactions on Communications","bibliographic_titleLang":"en"}]}]},"item_10001_description_36":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"The very fast transients of micro-gap discharges driven by low voltage electrostatic discharging (ESDs) are investigated in the time domain. We previously developed a 12 GHz wideband measurement setup consisting of a distributed constant line system, however the observed transients due to micro-gap discharges had very fast rise times of 34 ps or less, which reached the limitation on our system. In this paper, we proposed a method for estimating wideband transients beyond the measurement limit by using the transmission loss of a high performance coaxial transmission line. The proposed method is validated by estimating an impulsive voltage waveform with rise/fall time of 16 ps from the waveform measured through a semi-rigid coaxial cable with a length of 10 m.","subitem_description_language":"en","subitem_description_type":"Other"}]},"item_10001_full_name_27":{"attribute_name":"著者別名","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"573","nameIdentifierScheme":"WEKO"}],"names":[{"name":"藤原, 修"}]}]},"item_10001_publisher_29":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"Institute of Electronics, Information and Communication Engineers","subitem_publisher_language":"en"}]},"item_10001_source_id_30":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0916-8516","subitem_source_identifier_type":"ISSN"}]},"item_10001_source_id_32":{"attribute_name":"item_10001_source_id_32","attribute_value_mlt":[{"subitem_source_identifier":"AA10826261","subitem_source_identifier_type":"NCID"}]},"item_10001_version_type_33":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Kawamata, Ken","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"19067","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Minegishi, Shigeki","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"19068","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Taka, Yoshinori","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"19069","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Fujiwara, Osamu","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"573","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-01-25"}],"displaytype":"detail","filename":"E92-B_1965.pdf","filesize":[{"value":"597.6 kB"}],"format":"application/pdf","license_note":"Copyright(c)2009 IEICE　http://search.ieice.org/index.html","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"本文_fulltext","url":"https://nitech.repo.nii.ac.jp/record/5448/files/E92-B_1965.pdf"},"version_id":"ec8b5b68-c6cd-4c84-8af3-449f5dd8820c"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"item_resource_type","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"A Method for Estimating Wideband Transients Using Transmission Loss of High Performance Semi-Rigid Coaxial Cable","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"A Method for Estimating Wideband Transients Using Transmission Loss of High Performance Semi-Rigid Coaxial Cable","subitem_title_language":"en"}]},"item_type_id":"10001","owner":"91","path":["31"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2013-06-25"},"publish_date":"2013-06-25","publish_status":"0","recid":"5448","relation_version_is_last":true,"title":["A Method for Estimating Wideband Transients Using Transmission Loss of High Performance Semi-Rigid Coaxial Cable"],"weko_creator_id":"91","weko_shared_id":-1},"updated":"2025-03-21T03:05:11.590848+00:00"}