{"created":"2023-05-15T12:36:19.175122+00:00","id":5574,"links":{},"metadata":{"_buckets":{"deposit":"068668e5-cc80-4e8b-8e6d-0adafe258dc2"},"_deposit":{"created_by":3,"id":"5574","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"5574"},"status":"published"},"_oai":{"id":"oai:nitech.repo.nii.ac.jp:00005574","sets":["31"]},"author_link":["19785","19786","8615"],"item_10001_biblio_info_28":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2011-09-11","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"5","bibliographicPageEnd":"054108-8","bibliographicPageStart":"054108-1","bibliographicVolumeNumber":"110","bibliographic_titles":[{"bibliographic_title":"Journal of Applied Physics"}]}]},"item_10001_description_36":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"We examined the influence of dielectric stiffness, interface, and layer thickness on the hysteresis loops, including the remanent polarization and coercive field of a superlattice comprising alternate layers of ferroelectric and dielectric, using the Landau-Ginzburg theory. An interface energy term is introduced in the free energy functional to describe the formation of interface dead layers that are mutually coupled through polarization (or induced-polarization). Our studies reveal that the hysteresis loop is strongly dependent on the stiffness of the dielectric layer, the strength of the interface coupling and layer thickness. The intrinsic coupling at the interface between two neighboring layers reduces the coercive field, though the corresponding remanent polarization is significantly enhanced by a soft dielectric layer.","subitem_description_type":"Other"}]},"item_10001_description_38":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_10001_full_name_27":{"attribute_name":"著者別名","attribute_value_mlt":[{"nameIdentifiers":[{},{}],"names":[{"name":"岩田, 真"}]}]},"item_10001_publisher_29":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"American Institute of Physics"}]},"item_10001_relation_34":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"10.1063/1.3630016"}],"subitem_relation_type":"isIdenticalTo","subitem_relation_type_id":{"subitem_relation_type_id_text":"http://dx.doi.org/10.1063/1.3630016","subitem_relation_type_select":"DOI"}}]},"item_10001_source_id_30":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"00218979","subitem_source_identifier_type":"ISSN"}]},"item_10001_source_id_32":{"attribute_name":"書誌レコードID（NCID）","attribute_value_mlt":[{"subitem_source_identifier":"AA00693547","subitem_source_identifier_type":"NCID"}]},"item_10001_version_type_33":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Chew, KhianHooi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Ong, LyeHock","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Iwata, Makoto","creatorNameLang":"en"}],"nameIdentifiers":[{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2017-01-26"}],"displaytype":"detail","filename":"IwataMakoto_2011_AIP.pdf","filesize":[{"value":"1.1 MB"}],"format":"application/pdf","license_note":"Copyright (2011) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.The following article appeared in Journal of Applied Physics, 110, 054108 ; 2011 and may be found at http://dx.doi.org/10.1063/1.3630016","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"本文_fulltext","url":"https://nitech.repo.nii.ac.jp/record/5574/files/IwataMakoto_2011_AIP.pdf"},"version_id":"d5b1cce3-15e7-49c6-8781-0f997138b913"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Influence of Dielectric Stiffness, Interface and Layer Thickness on Hysteresis Loops of Ferroelectric Superlattices","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Influence of Dielectric Stiffness, Interface and Layer Thickness on Hysteresis Loops of Ferroelectric Superlattices","subitem_title_language":"en"}]},"item_type_id":"10001","owner":"3","path":["31"],"pubdate":{"attribute_name":"公開日","attribute_value":"2013-04-01"},"publish_date":"2013-04-01","publish_status":"0","recid":"5574","relation_version_is_last":true,"title":["Influence of Dielectric Stiffness, Interface and Layer Thickness on Hysteresis Loops of Ferroelectric Superlattices"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-05-15T14:20:07.040240+00:00"}