{"created":"2023-05-15T12:36:49.891483+00:00","id":6317,"links":{},"metadata":{"_buckets":{"deposit":"18e6a8aa-533c-4dcc-853e-58acbfae2481"},"_deposit":{"created_by":3,"id":"6317","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"6317"},"status":"published"},"_oai":{"id":"oai:nitech.repo.nii.ac.jp:00006317","sets":["31"]},"author_link":["8617","8508"],"item_5_biblio_info_5":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2016","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"1131","bibliographicPageStart":"1126","bibliographic_titles":[{},{"bibliographic_title":"2016 IEEE 25th International Symposium on Industrial Electronics (ISIE)","bibliographic_titleLang":"en"}]}]},"item_5_description_16":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_5_description_4":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"Santa Clara, US, 8-10 June 2016","subitem_description_type":"Other"}]},"item_5_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"affiliations":[{"affiliationNames":[{"affiliationName":"","lang":"ja"}],"nameIdentifiers":[{"nameIdentifier":"","nameIdentifierScheme":"ISNI","nameIdentifierURI":"http://www.isni.org/isni/"}]}],"familyNames":[{"familyName":"前田","familyNameLang":"ja"},{"familyName":"Maeda","familyNameLang":"en"},{"familyName":"マエダ","familyNameLang":"ja-Kana"}],"givenNames":[{"givenName":"佳弘","givenNameLang":"ja"},{"givenName":"Yoshihiro","givenNameLang":"en"},{"givenName":"ヨシヒロ","givenNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"8508","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"1000070769869","nameIdentifierScheme":"NRID","nameIdentifierURI":"http://rns.nii.ac.jp/nr/1000070769869"}],"names":[{"name":"前田, 佳弘","nameLang":"ja"},{"name":"Maeda, Yoshihiro","nameLang":"en"},{"name":"マエダ, ヨシヒロ","nameLang":"ja-Kana"}]},{"affiliations":[{"affiliationNames":[{"affiliationName":"","lang":"ja"}],"nameIdentifiers":[{"nameIdentifier":"","nameIdentifierScheme":"ISNI","nameIdentifierURI":"http://www.isni.org/isni/"}]}],"familyNames":[{"familyName":"岩崎","familyNameLang":"ja"},{"familyName":"イワサキ","familyNameLang":"ja-Kana"},{"familyName":"Iwasaki","familyNameLang":"en"}],"givenNames":[{"givenName":"誠","givenNameLang":"ja"},{"givenName":"マコト","givenNameLang":"ja-Kana"},{"givenName":"Makoto","givenNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"8617","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"1000010232662","nameIdentifierScheme":"NRID","nameIdentifierURI":"http://rns.nii.ac.jp/nr/1000010232662"}],"names":[{"name":"岩崎, 誠","nameLang":"ja"},{"name":"イワサキ, マコト","nameLang":"ja-Kana"},{"name":"Iwasaki, Makoto","nameLang":"en"}]}]},"item_5_publisher_6":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE"}]},"item_5_relation_10":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"10.1109/ISIE.2016.7745052"}],"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"http://doi.org/10.1109/ISIE.2016.7745052","subitem_relation_type_select":"DOI"}}]},"item_5_relation_7":{"attribute_name":"ISBN","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"9781509008735","subitem_relation_type_select":"ISBN"}}]},"item_5_version_type_13":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":"","affiliationNameIdentifierScheme":"ISNI","affiliationNameIdentifierURI":"http://www.isni.org/isni/"}],"affiliationNames":[{"affiliationName":"","affiliationNameLang":"ja"}]}],"creatorNames":[{"creatorName":"前田, 佳弘","creatorNameLang":"ja"},{"creatorName":"Maeda, Yoshihiro","creatorNameLang":"en"},{"creatorName":"マエダ, ヨシヒロ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{"givenNameLang":"ja"},{"givenNameLang":"en"},{"givenNameLang":"ja-Kana"}],"nameIdentifiers":[{},{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":"","affiliationNameIdentifierScheme":"ISNI","affiliationNameIdentifierURI":"http://www.isni.org/isni/"}],"affiliationNames":[{"affiliationName":"","affiliationNameLang":"ja"}]}],"creatorNames":[{"creatorName":"岩崎, 誠","creatorNameLang":"ja"},{"creatorName":"イワサキ, マコト","creatorNameLang":"ja-Kana"},{"creatorName":"Iwasaki, Makoto","creatorNameLang":"en"}],"familyNames":[{},{},{}],"givenNames":[{"givenNameLang":"ja"},{"givenNameLang":"ja-Kana"},{"givenNameLang":"en"}],"nameIdentifiers":[{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2018-07-24"}],"displaytype":"detail","filename":"MaedaYoshihiro_2016_A2.pdf","filesize":[{"value":"558.3 kB"}],"format":"application/pdf","license_note":"(C)2016 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. ","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"本文_fulltext","url":"https://nitech.repo.nii.ac.jp/record/6317/files/MaedaYoshihiro_2016_A2.pdf"},"version_id":"a1acb007-dc99-4f72-8f22-b7c676717674"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"Analysis of Response Variation in Fast and Precise Micrometer Stroke Positioning","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Analysis of Response Variation in Fast and Precise Micrometer Stroke Positioning","subitem_title_language":"en"}]},"item_type_id":"5","owner":"3","path":["31"],"pubdate":{"attribute_name":"公開日","attribute_value":"2018-07-24"},"publish_date":"2018-07-24","publish_status":"0","recid":"6317","relation_version_is_last":true,"title":["Analysis of Response Variation in Fast and Precise Micrometer Stroke Positioning"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2023-10-06T09:28:22.409365+00:00"}