{"created":"2023-05-15T12:36:53.905789+00:00","id":6417,"links":{},"metadata":{"_buckets":{"deposit":"1494528d-dda3-48d0-8919-c10f87946b88"},"_deposit":{"created_by":91,"id":"6417","owners":[91],"pid":{"revision_id":0,"type":"depid","value":"6417"},"status":"published"},"_oai":{"id":"oai:nitech.repo.nii.ac.jp:00006417","sets":["31"]},"author_link":["8594","20810","8594","22459","22458","22461","22462","22460","9425"],"item_10001_biblio_info_28":{"attribute_name":"bibliographic_information","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2017-11","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"11","bibliographicPageEnd":"6708","bibliographicPageStart":"6704","bibliographicVolumeNumber":"46","bibliographic_titles":[{"bibliographic_title":"Journal of Electronic Materials","bibliographic_titleLang":"en"}]}]},"item_10001_full_name_27":{"attribute_name":"著者別名","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"8594","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"1000020345945 ","nameIdentifierScheme":"NRID","nameIdentifierURI":"http://rns.nii.ac.jp/nr/1000020345945 "}],"names":[{"name":"ニラウラ, マダン"}]}]},"item_10001_publisher_29":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"Springer","subitem_publisher_language":"en"}]},"item_10001_relation_34":{"attribute_name":"item_10001_relation_34","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"10.1007/s11664-017-5703-6"}],"subitem_relation_type":"isVersionOf","subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.1007/s11664-017-5703-6","subitem_relation_type_select":"DOI"}}]},"item_10001_source_id_30":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0361-5235","subitem_source_identifier_type":"ISSN"}]},"item_10001_source_id_32":{"attribute_name":"item_10001_source_id_32","attribute_value_mlt":[{"subitem_source_identifier":"AA00697093","subitem_source_identifier_type":"NCID"}]},"item_10001_version_type_33":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Yasuda, K.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"20810","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Niraula, Madan","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"8594","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"1000020345945 ","nameIdentifierScheme":"NRID","nameIdentifierURI":"http://rns.nii.ac.jp/nr/1000020345945 "}]},{"creatorNames":[{"creatorName":"Kojima, M.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"22459","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Kitagawa, S.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"22458","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Tsubota, S.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"22461","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Yamaguchi, T.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"22462","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Ozawa, J.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"22460","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Agata, Y.","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"9425","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2019-03-19"}],"displaytype":"detail","filename":"NiraulaMadan_2017_A2.pdf","filesize":[{"value":"510.0 kB"}],"format":"application/pdf","license_note":"This is a post-peer-review, pre-copyedit version of an article published in Journal of Electronic Materials. The final authenticated version is available online at: http://doi.org/10.1007/s11664-017-5703-6 ","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"本文_fulltext","url":"https://nitech.repo.nii.ac.jp/record/6417/files/NiraulaMadan_2017_A2.pdf"},"version_id":"318755d5-60f1-4fad-9e49-9f9c959f6e9b"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"item_resource_type","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Characterization of (211) and (100) CdTe Layers Grown on Si Substrates by Metalorganic Vapor- Phase Epitaxy","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Characterization of (211) and (100) CdTe Layers Grown on Si Substrates by Metalorganic Vapor- Phase Epitaxy","subitem_title_language":"en"}]},"item_type_id":"10001","owner":"91","path":["31"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2019-03-19"},"publish_date":"2019-03-19","publish_status":"0","recid":"6417","relation_version_is_last":true,"title":["Characterization of (211) and (100) CdTe Layers Grown on Si Substrates by Metalorganic Vapor- Phase Epitaxy"],"weko_creator_id":"91","weko_shared_id":-1},"updated":"2025-03-28T05:20:19.916166+00:00"}