{"created":"2023-05-15T12:37:07.845688+00:00","id":6803,"links":{},"metadata":{"_buckets":{"deposit":"61f6704e-8c1a-4e23-8f8c-84041416d9e1"},"_deposit":{"created_by":3,"id":"6803","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"6803"},"status":"published"},"_oai":{"id":"oai:nitech.repo.nii.ac.jp:00006803","sets":["418:652"]},"author_link":["12"],"item_9_alternative_title_1":{"attribute_name":"その他（別言語等）のタイトル","attribute_value_mlt":[{"subitem_alternative_title":"Equatorial Aberration for Continuous-Scan Integration with One-Dimensional Strip X-ray Detector"}]},"item_9_biblio_info_5":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2020-07-31","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"7","bibliographicPageStart":"1","bibliographicVolumeNumber":"8","bibliographic_titles":[{"bibliographic_title":"名古屋工業大学先進セラミックス研究センター年報 = Annual report Advanced Ceramics Research Center Nagoya Institute of Technology"}]}]},"item_9_description_10":{"attribute_name":"内容記述","attribute_value_mlt":[{"subitem_description":"Exact and approximate mathematical expressions about equatorial aberration for continuous-scan integration with strip-type X-ray detector are presented. The validity of the formulas is tested by numerical calculations and analysis of experimental date.","subitem_description_type":"Other"}]},"item_9_description_11":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_9_heading_13":{"attribute_name":"見出し","attribute_value_mlt":[{"subitem_heading_banner_headline":"<論文>","subitem_heading_language":"ja"},{"subitem_heading_banner_headline":"＜Original Paper＞","subitem_heading_language":"en"}]},"item_9_link_14":{"attribute_name":"論文ID（NAID）","attribute_value_mlt":[{"subitem_link_text":"40022352541","subitem_link_url":"https://ci.nii.ac.jp/naid/40022352541"}]},"item_9_publisher_6":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"名古屋工業大学先進セラミックス研究センター"}]},"item_9_source_id_7":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"21876738","subitem_source_identifier_type":"ISSN"}]},"item_9_source_id_8":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA12617342","subitem_source_identifier_type":"NCID"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":""}],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"井田, 隆","creatorNameLang":"ja"},{"creatorName":"イダ, タカシ","creatorNameLang":"ja-Kana"},{"creatorName":"Ida, Takashi","creatorNameLang":"en"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2021-09-27"}],"displaytype":"detail","filename":"arnit2019_1.pdf","filesize":[{"value":"1.2 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"本文_fulltext","url":"https://nitech.repo.nii.ac.jp/record/6803/files/arnit2019_1.pdf"},"version_id":"336a5ba3-319a-46c9-b425-c5135f48e682"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Si strip detector","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"Bragg-Brentano geometry","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"convolution","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"powder diffraction","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"一次元ストリップ型X線検出器の連続走査積算測定における赤道収差","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"一次元ストリップ型X線検出器の連続走査積算測定における赤道収差"}]},"item_type_id":"9","owner":"3","path":["652"],"pubdate":{"attribute_name":"公開日","attribute_value":"2021-09-27"},"publish_date":"2021-09-27","publish_status":"0","recid":"6803","relation_version_is_last":true,"title":["一次元ストリップ型X線検出器の連続走査積算測定における赤道収差"],"weko_creator_id":"3","weko_shared_id":3},"updated":"2024-01-31T04:35:33.333222+00:00"}