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Reliability Studies on MOCVD Grown AlGaN/GaN HEMT on Si Substrate
https://nitech.repo.nii.ac.jp/records/1587
https://nitech.repo.nii.ac.jp/records/15874769b7e2-7d6f-41c9-8499-2eecb34b51e9
名前 / ファイル | ライセンス | アクション |
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本文_fulltext (20.4 MB)
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Item type | 紀要論文 / Departmental Bulletin Paper_04(1) | |||||
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公開日 | 2016-06-07 | |||||
タイトル | ||||||
タイトル | Reliability Studies on MOCVD Grown AlGaN/GaN HEMT on Si Substrate | |||||
言語 | ||||||
言語 | jpn | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | departmental bulletin paper | |||||
著者 |
名古屋工業大学, 極微デバイス機能システム研究センター
× 名古屋工業大学, 極微デバイス機能システム研究センター |
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著者別名 | ||||||
姓名 | Research, Center for Nano-Device and System Nagoya Institute of Technology | |||||
書誌情報 |
極微デバイス機能システム研究センター報告書 = Technical report at Research Center for Nano-Device and System 巻 11, p. 1-92, 発行日 2014-03 |
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出版者 | ||||||
出版者 | 名古屋工業大学極微デバイス機能システム研究センター | |||||
書誌レコードID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AA12036883 | |||||
著者版フラグ | ||||||
出版タイプ | VoR | |||||
出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||
フォーマット | ||||||
内容記述タイプ | Other | |||||
内容記述 | application/pdf |