WEKO3
アイテム
{"_buckets": {"deposit": "35d90a67-9a8e-4de0-be55-8e18e13350ca"}, "_deposit": {"created_by": 3, "id": "3951", "owners": [3], "pid": {"revision_id": 0, "type": "depid", "value": "3951"}, "status": "published"}, "_oai": {"id": "oai:nitech.repo.nii.ac.jp:00003951", "sets": ["31"]}, "author_link": ["11392", "11390", "11389", "8562"], "item_10001_biblio_info_28": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "1988-07-15", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "3", "bibliographicPageEnd": "1941", "bibliographicPageStart": "1938", "bibliographicVolumeNumber": "38", "bibliographic_titles": [{"bibliographic_title": "PHYSICAL REVIEW B"}]}]}, "item_10001_description_36": {"attribute_name": "内容記述", "attribute_value_mlt": [{"subitem_description": "In conventional EXAFS (extended x-ray-absorption fine-structure) analyses, reliable structures are obtained with different values of absorption-edge energy E0 for different neighboring atoms. It is shown in this study that the Ge K-edge EXAFS resulting from the Ge-Ge and Ge-Si bonds in hydrogenated amorphous Si-Ge alloys can be excellently explained by a unique E0 value provided that a newly developed formula based on the spherical wave functions of photoelectrons is employed. The E0 value is just at the steepest point in the experimental edge-jump curve. With the conventional formula the adjusted E0 values for the Ge-Ge and Ge-Si bonds differ by 7 eV at maximum, and in addition they deviate by 3 eV at least from the steepest point.", "subitem_description_type": "Other"}]}, "item_10001_description_38": {"attribute_name": "フォーマット", "attribute_value_mlt": [{"subitem_description": "application/pdf", "subitem_description_type": "Other"}]}, "item_10001_full_name_27": {"attribute_name": "著者別名", "attribute_value_mlt": [{"nameIdentifiers": [{"nameIdentifier": "8562", "nameIdentifierScheme": "WEKO"}], "names": [{"name": "西野, 洋一"}]}]}, "item_10001_publisher_29": {"attribute_name": "出版者", "attribute_value_mlt": [{"subitem_publisher": "American Physical Society"}]}, "item_10001_relation_34": {"attribute_name": "DOI", "attribute_value_mlt": [{"subitem_relation_name": [{"subitem_relation_name_text": "10.1103/PhysRevB.38.1938"}], "subitem_relation_type": "isIdenticalTo", "subitem_relation_type_id": {"subitem_relation_type_id_text": "http://dx.doi.org/10.1103/PhysRevB.38.1938", "subitem_relation_type_select": "DOI"}}]}, "item_10001_source_id_30": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "01631829", "subitem_source_identifier_type": "ISSN"}]}, "item_10001_source_id_32": {"attribute_name": "書誌レコードID(NCID)", "attribute_value_mlt": [{"subitem_source_identifier": "AA00362255", "subitem_source_identifier_type": "NCID"}]}, "item_10001_version_type_33": {"attribute_name": "著者版フラグ", "attribute_value_mlt": [{"subitem_version_resource": "http://purl.org/coar/version/c_970fb48d4fbd8a85", "subitem_version_type": "VoR"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Kajiyama, Hiroshi", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "11389", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Fukuhara, Akira", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "11390", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Nishino, Yoichi", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "8562", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Muramatsu, Shinichi", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "11392", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2017-01-23"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "PRB 38_1938.pdf", "filesize": [{"value": "680.2 kB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensefree": "(c)1988 The American Physical Society", "licensetype": "license_free", "mimetype": "application/pdf", "size": 680200.0, "url": {"label": "本文_fulltext", "url": "https://nitech.repo.nii.ac.jp/record/3951/files/PRB 38_1938.pdf"}, "version_id": "5f3b6c7f-1221-457f-ba46-9910ed79fe86"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "Extended x-ray-absorption fine-structure study of hydrogenated amorphous silicon-germanium alloys. I. Analysis based on spherical waves of photoelectrons", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "Extended x-ray-absorption fine-structure study of hydrogenated amorphous silicon-germanium alloys. I. Analysis based on spherical waves of photoelectrons", "subitem_title_language": "en"}]}, "item_type_id": "10001", "owner": "3", "path": ["31"], "permalink_uri": "https://nitech.repo.nii.ac.jp/records/3951", "pubdate": {"attribute_name": "公開日", "attribute_value": "2012-11-06"}, "publish_date": "2012-11-06", "publish_status": "0", "recid": "3951", "relation": {}, "relation_version_is_last": true, "title": ["Extended x-ray-absorption fine-structure study of hydrogenated amorphous silicon-germanium alloys. I. Analysis based on spherical waves of photoelectrons"], "weko_shared_id": 3}
Extended x-ray-absorption fine-structure study of hydrogenated amorphous silicon-germanium alloys. I. Analysis based on spherical waves of photoelectrons
https://nitech.repo.nii.ac.jp/records/3951
https://nitech.repo.nii.ac.jp/records/3951a844139b-48f0-4a3a-8e7c-677ec0277da6
名前 / ファイル | ライセンス | アクション |
---|---|---|
本文_fulltext (680.2 kB)
|
(c)1988 The American Physical Society
|
Item type | 学術雑誌論文 / Journal Article(1) | |||||
---|---|---|---|---|---|---|
公開日 | 2012-11-06 | |||||
タイトル | ||||||
言語 | en | |||||
タイトル | Extended x-ray-absorption fine-structure study of hydrogenated amorphous silicon-germanium alloys. I. Analysis based on spherical waves of photoelectrons | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
著者 |
Kajiyama, Hiroshi
× Kajiyama, Hiroshi× Fukuhara, Akira× Nishino, Yoichi× Muramatsu, Shinichi |
|||||
著者別名 | ||||||
姓名 | 西野, 洋一 | |||||
書誌情報 |
PHYSICAL REVIEW B 巻 38, 号 3, p. 1938-1941, 発行日 1988-07-15 |
|||||
出版者 | ||||||
出版者 | American Physical Society | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 01631829 | |||||
書誌レコードID(NCID) | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AA00362255 | |||||
著者版フラグ | ||||||
出版タイプ | VoR | |||||
出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||
DOI | ||||||
関連タイプ | isIdenticalTo | |||||
識別子タイプ | DOI | |||||
関連識別子 | http://dx.doi.org/10.1103/PhysRevB.38.1938 | |||||
関連名称 | 10.1103/PhysRevB.38.1938 | |||||
内容記述 | ||||||
内容記述タイプ | Other | |||||
内容記述 | In conventional EXAFS (extended x-ray-absorption fine-structure) analyses, reliable structures are obtained with different values of absorption-edge energy E0 for different neighboring atoms. It is shown in this study that the Ge K-edge EXAFS resulting from the Ge-Ge and Ge-Si bonds in hydrogenated amorphous Si-Ge alloys can be excellently explained by a unique E0 value provided that a newly developed formula based on the spherical wave functions of photoelectrons is employed. The E0 value is just at the steepest point in the experimental edge-jump curve. With the conventional formula the adjusted E0 values for the Ge-Ge and Ge-Si bonds differ by 7 eV at maximum, and in addition they deviate by 3 eV at least from the steepest point. | |||||
フォーマット | ||||||
内容記述タイプ | Other | |||||
内容記述 | application/pdf |