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Fabrication and Characterization of X-Ray Spectroscopic Imaging Arrays Based on Thick Single-Crystal CdTe Epitaxial Layers
https://nitech.repo.nii.ac.jp/records/5754
https://nitech.repo.nii.ac.jp/records/5754c8322729-4c48-40b2-8b9a-39b57451e4b0
名前 / ファイル | ライセンス | アクション |
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本文_fulltext (218.8 kB)
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(c)2012 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
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Item type | 学術雑誌論文 / Journal Article(1) | |||||
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公開日 | 2015-05-27 | |||||
タイトル | ||||||
言語 | en | |||||
タイトル | Fabrication and Characterization of X-Ray Spectroscopic Imaging Arrays Based on Thick Single-Crystal CdTe Epitaxial Layers | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
著者 |
Niraula, Madan
× Niraula, Madan× Yasuda, Kazuhito× Namba, Syuhei× Kondo, Takaki× Muramatsu, Shinya× Yamashita, Hayate× Wajima, Yuto× Agata, Yasunori |
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著者別名 | ||||||
姓名 | ニラウラ, マダン | |||||
著者別名 | ||||||
姓名 | 安田, 和人 | |||||
書誌情報 |
IEEE Transactions on Electron Devices 巻 59, 号 12, p. 3450-3455, 発行日 2012-12 |
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出版者 | ||||||
出版者 | Institute of Electrical and Electronics Engineers | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 00189383 | |||||
書誌レコードID(NCID) | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AA00667820 | |||||
著者版フラグ | ||||||
出版タイプ | AM | |||||
出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa | |||||
DOI | ||||||
関連タイプ | isVersionOf | |||||
識別子タイプ | DOI | |||||
関連識別子 | http://dx.doi.org/10.1109/TED.2012.2222413 | |||||
関連名称 | 10.1109/TED.2012.2222413 | |||||
フォーマット | ||||||
内容記述タイプ | Other | |||||
内容記述 | application/pdf |