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一次元ストリップ型X線検出器の連続走査積算測定における赤道収差
https://nitech.repo.nii.ac.jp/records/6803
https://nitech.repo.nii.ac.jp/records/680389173344-4448-4e5d-a30e-76b227718ff5
名前 / ファイル | ライセンス | アクション |
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本文_fulltext (1.2 MB)
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Item type | 紀要論文 / Departmental Bulletin Paper_04(1) | |||||
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公開日 | 2021-09-27 | |||||
タイトル | ||||||
タイトル | 一次元ストリップ型X線検出器の連続走査積算測定における赤道収差 | |||||
言語 | ||||||
言語 | jpn | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | departmental bulletin paper | |||||
その他(別言語等)のタイトル | ||||||
その他のタイトル | Equatorial Aberration for Continuous-Scan Integration with One-Dimensional Strip X-ray Detector | |||||
著者 |
井田, 隆
× 井田, 隆 |
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書誌情報 |
名古屋工業大学先進セラミックス研究センター年報 = Annual report Advanced Ceramics Research Center Nagoya Institute of Technology 巻 8, p. 1-7, 発行日 2020-07-31 |
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出版者 | ||||||
出版者 | 名古屋工業大学先進セラミックス研究センター | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 21876738 | |||||
書誌レコードID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AA12617342 | |||||
論文ID(NAID) | ||||||
40022352541 | ||||||
https://ci.nii.ac.jp/naid/40022352541 | ||||||
内容記述 | ||||||
内容記述タイプ | Other | |||||
内容記述 | Exact and approximate mathematical expressions about equatorial aberration for continuous-scan integration with strip-type X-ray detector are presented. The validity of the formulas is tested by numerical calculations and analysis of experimental date. | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | Si strip detector | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | Bragg-Brentano geometry | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | convolution | |||||
キーワード | ||||||
言語 | en | |||||
主題Scheme | Other | |||||
主題 | powder diffraction | |||||
フォーマット | ||||||
内容記述タイプ | Other | |||||
内容記述 | application/pdf | |||||
見出し | ||||||
大見出し | <論文> | |||||
言語 | ja | |||||
見出し | ||||||
大見出し | <Original Paper> | |||||
言語 | en |