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検出器多連装型高分解能軌道放射光粉末回折計により測定された回折データの解析法の開発
https://nitech.repo.nii.ac.jp/records/2282
https://nitech.repo.nii.ac.jp/records/2282a7c80da0-4d7b-4e98-955f-8065155b0371
名前 / ファイル | ライセンス | アクション |
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本文_fulltext (444.7 kB)
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Item type | 紀要論文 / Departmental Bulletin Paper_04(1) | |||||
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公開日 | 2011-08-08 | |||||
タイトル | ||||||
タイトル | 検出器多連装型高分解能軌道放射光粉末回折計により測定された回折データの解析法の開発 | |||||
言語 | ||||||
言語 | jpn | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | departmental bulletin paper | |||||
その他(別言語等)のタイトル | ||||||
その他のタイトル | ケンシュツキ タレンソウガタ コウブンカイノウ キドウ ホウシャコウ フンマツ カイセキケイ ニヨリ ソクテイ サレタ カイセキ データ ノ カイセキホウ ノ カイハツ | |||||
その他(別言語等)のタイトル | ||||||
その他のタイトル | Development of Analytical Method for Diffraction Intensity Data Measured with a High-Resolution Synchrotron X-ray Powder Diffractometer | |||||
その他(別言語等)のタイトル | ||||||
その他のタイトル | Development of Analytical Method for Diffraction Intensity Data Measured with a High-Resolution Synchrotron X-ray Powder Diffractomete | |||||
著者 |
井田, 隆
× 井田, 隆× 日比野, 寿 |
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著者別名 | ||||||
姓名 | 井田, 隆 | |||||
言語 | ja | |||||
姓名 | イダ, タカシ | |||||
言語 | ja-Kana | |||||
姓名 | Ida, Takashi | |||||
言語 | en | |||||
著者別名 | ||||||
姓名 | Hibino, Hisashi | |||||
書誌情報 |
セラミックス基盤工学研究センター年報 = Annual report of the Ceramics Research Laboratory Nagoya Institute of Technology 巻 5, p. 1-11, 発行日 2006-03-31 |
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出版者 | ||||||
出版者 | 名古屋工業大学セラミックス基盤工学研究センター | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 13471694 | |||||
書誌レコードID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AA11625130 | |||||
著者版フラグ | ||||||
出版タイプ | VoR | |||||
出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||
内容記述 | ||||||
内容記述タイプ | Other | |||||
内容記述 | A new analytical method to obtain a series of aberration-free diffraction intensity data from the segmented intensity data collectedwith a high-resolution synchrotron X-ray powder diffractometer with a multiple-detector system has been developed. The methodincludes (i) adjustment of variation in peak profiles measured with different detectors, (ii) deconvolution of axial-divergenceaberration, and (iii) removal of asymmetry introduced by the aberration of the beamline optics. The method has been applied toanalyze the diffraction intensity data of a ZnO powder sample (NIST SRM674) measured with a multiple-detector diffractometer(MDS) on the beamline 4B2 at the Photon Factory, KEK in Tsukuba. The characteristics of the beamline aberration had beenseparately evaluated by analyzing the diffraction intensity data of Si powder (NIST SRM640b). It has been confirmed that theobserved asymmetry caused by the aberrations of the beamline-optics and the diffractometer can certainly be removed by the method.As a result, the integrated diffraction intensity can easily be evaluated by profile fitting method based on application of a simplesymmetric model profile function. | |||||
フォーマット | ||||||
内容記述タイプ | Other | |||||
内容記述 | application/pdf | |||||
見出し | ||||||
大見出し | <論文> | |||||
言語 | ja | |||||
見出し | ||||||
大見出し | <Paper> | |||||
言語 | en |