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アイテム / Characterization of Fine-Pixel X-ray Imaging Detector Array Fabricated by Using Thick Single-Crystal CdTe Layers on Si Substrates Grown by MOVPE / NiraulaMadan_2018_A3
NiraulaMadan_2018_A3
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NiraulaMadan_2018_A3.pdf (536.0 kB) sha256 c2ab4818a129622629cc9d56dfbab8c3ee568069440b8850abc5ad38b4410b73 | (C)2019 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. |
公開日 | 2020-11-11 | |||||
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ファイル名 | NiraulaMadan_2018_A3.pdf | |||||
本文URL | https://nitech.repo.nii.ac.jp/record/6633/files/NiraulaMadan_2018_A3.pdf | |||||
ラベル | 本文_fulltext | |||||
フォーマット | application/pdf | |||||
サイズ | 536.0 kB |
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