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  1. 研究論文

Nondestructive measurements of depth distribution of carrier lifetimes in 4H–SiC thick epitaxial layers using time-resolved free carrier absorption with intersectional lights

https://nitech.repo.nii.ac.jp/records/6646
https://nitech.repo.nii.ac.jp/records/6646
607503e3-f2ac-4ec4-9fcb-89f2689a5df9
名前 / ファイル ライセンス アクション
KatoMasashi_2020_A3.pdf 本文_fulltext (2.7 MB)
This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing.
The following article appeared in T. Hirayama et al., Rev. sci. instrum. 91, 123902 (2020) and may be found at https://doi.org/10.1063/5.0018080.
Item type 学術雑誌論文 / Journal Article(1)
公開日 2020-12-10
タイトル
言語 en
タイトル Nondestructive measurements of depth distribution of carrier lifetimes in 4H–SiC thick epitaxial layers using time-resolved free carrier absorption with intersectional lights
言語
言語 eng
資源タイプ
資源タイプ識別子 http://purl.org/coar/resource_type/c_6501
資源タイプ journal article
著者 Hirayama, Takashi

× Hirayama, Takashi

WEKO 22759

en Hirayama, Takashi

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Nagaya, Keisuke

× Nagaya, Keisuke

WEKO 22760

en Nagaya, Keisuke

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Miyasaka, Akira

× Miyasaka, Akira

WEKO 22761

en Miyasaka, Akira

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Kojima, Kazutoshi

× Kojima, Kazutoshi

WEKO 22720

en Kojima, Kazutoshi

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Kato, Tomohisa

× Kato, Tomohisa

WEKO 22721

en Kato, Tomohisa

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Okumura, Hajime

× Okumura, Hajime

WEKO 22722

en Okumura, Hajime

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Kato, Masashi

× Kato, Masashi

WEKO 8609
NRID 1000080362317

en Kato, Masashi

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著者別名
姓名 加藤, 正史
書誌情報 en : Review of Scientific Instruments

巻 91, 号 12, p. 123902, 発行日 2020-12-07
出版者
出版者 American Institute of Physics
ISSN
収録物識別子タイプ ISSN
収録物識別子 00346748
書誌レコードID(NCID)
収録物識別子タイプ NCID
収録物識別子 AA00817730
著者版フラグ
出版タイプ AM
出版タイプResource http://purl.org/coar/version/c_ab4af688f83e57aa
DOI
関連タイプ isVersionOf
識別子タイプ DOI
関連識別子 https://doi.org/10.1063/5.0018080
関連名称 10.1063/5.0018080
フォーマット
内容記述タイプ Other
内容記述 application/pdf
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