WEKO3
アイテム
Ultrathin-film differential-thermal-analysis apparatus with simultaneous photoemission measurements
https://nitech.repo.nii.ac.jp/records/4811
https://nitech.repo.nii.ac.jp/records/4811ea779fe5-2796-4b24-b129-998ff546cb09
| 名前 / ファイル | ライセンス | アクション |
|---|---|---|
本文_fulltext (112.6 kB)
|
Copyright (2000) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.The following article appeared in Review of Scientific Instruments, 71(4), pp.1788- 1792 ; 2000 and may be found at http://link.aip.org/link/?rsi/71/1788
|
| Item type | 学術雑誌論文 / Journal Article(1) | |||||||||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| 公開日 | 2012-11-06 | |||||||||||||||||||||||||
| タイトル | ||||||||||||||||||||||||||
| タイトル | Ultrathin-film differential-thermal-analysis apparatus with simultaneous photoemission measurements | |||||||||||||||||||||||||
| 言語 | en | |||||||||||||||||||||||||
| 言語 | ||||||||||||||||||||||||||
| 言語 | eng | |||||||||||||||||||||||||
| 資源タイプ | ||||||||||||||||||||||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||||||||||||||||||||||
| 資源タイプ | journal article | |||||||||||||||||||||||||
| 著者 |
山本, 靖
× 山本, 靖
× Enami, Toshiaki
× Kuroi, Masakazu
× Matsuie, Noritaka
× Ishii, Hisao
× Seki, Kazuhiko
× Ouchi, Yukio
|
|||||||||||||||||||||||||
| 著者別名 | ||||||||||||||||||||||||||
| 姓名 | Yamamoto, Yasushi | |||||||||||||||||||||||||
| 言語 | en | |||||||||||||||||||||||||
| 姓名 | 山本, 靖 | |||||||||||||||||||||||||
| 言語 | ja | |||||||||||||||||||||||||
| 姓名 | ヤマモト, ヤスシ | |||||||||||||||||||||||||
| 言語 | ja-Kana | |||||||||||||||||||||||||
| bibliographic_information |
en : REVIEW OF SCIENTIFIC INSTRUMENTS 巻 71, 号 4, p. 1788-1792, 発行日 2000-04 |
|||||||||||||||||||||||||
| 出版者 | ||||||||||||||||||||||||||
| 出版者 | American Institute of Physics | |||||||||||||||||||||||||
| 言語 | en | |||||||||||||||||||||||||
| ISSN | ||||||||||||||||||||||||||
| 収録物識別子タイプ | ISSN | |||||||||||||||||||||||||
| 収録物識別子 | 0034-6748 | |||||||||||||||||||||||||
| item_10001_source_id_32 | ||||||||||||||||||||||||||
| 収録物識別子タイプ | NCID | |||||||||||||||||||||||||
| 収録物識別子 | AA00817730 | |||||||||||||||||||||||||
| 出版タイプ | ||||||||||||||||||||||||||
| 出版タイプ | VoR | |||||||||||||||||||||||||
| 出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||||||||||||||||||||||
| 内容記述 | ||||||||||||||||||||||||||
| 内容記述タイプ | Other | |||||||||||||||||||||||||
| 内容記述 | We developed an apparatus of differential thermal analysis (DTA) capable of simultaneous surface specific ultraviolet (UV) photoemission measurements to investigate thin-film phase transitions. The apparatus was installed in a vacuum chamber of 10-6Torr range for thermal isolation and the measurements of UV photoemission. As a sample substrate, we used a thin (10 μm) copper sheet supported by two wires for optimal thermal resistivity. The performance of the apparatus was examined using a 650-A-thick pentacontane (n-C50H102) film, which may exhibit a unique monolayer phase transition known as surface freezing. We observed two anomalies of DTA curve around the bulk melting temperature, one of which is apparently due to the bulk melting. Since the temperature dependence of the surface specific UV photoemission measurements showed corresponding changes in photoemission current, we could conclude that the other phase transition peak originates from the surface freezing effect. This demonstrates that our DTA-UV apparatus is sufficiently sensitive to examine such monolayer phase transitions. | |||||||||||||||||||||||||
| 言語 | en | |||||||||||||||||||||||||
