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Experimental demonstration for scanning near-field optical microscopy using a metal micro-slit probe at millimeter wavelengths
https://nitech.repo.nii.ac.jp/records/4519
https://nitech.repo.nii.ac.jp/records/4519bd2acf11-038f-45d4-8e04-1fb564a54836
| 名前 / ファイル | ライセンス | アクション |
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本文_fulltext (280.7 kB)
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Copyright (1997) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.The following article appeared in Applied physics letters, 71(24),pp.3581-3583 ; 1997 and may be found at http://link.aip.org/link/?apl/71/3581
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| Item type | 学術雑誌論文 / Journal Article(1) | |||||||||||||||||||||
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| 公開日 | 2012-11-06 | |||||||||||||||||||||
| タイトル | ||||||||||||||||||||||
| タイトル | Experimental demonstration for scanning near-field optical microscopy using a metal micro-slit probe at millimeter wavelengths | |||||||||||||||||||||
| 言語 | en | |||||||||||||||||||||
| 言語 | ||||||||||||||||||||||
| 言語 | eng | |||||||||||||||||||||
| 資源タイプ | ||||||||||||||||||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||||||||||||||||||
| 資源タイプ | journal article | |||||||||||||||||||||
| 著者 |
裵, 鐘石
× 裵, 鐘石
× Okamoto, Tatsuya
× Fujii, Tetsu
× Mizuno, Koji
× Nozokido, Tatsuo
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| 著者別名 | ||||||||||||||||||||||
| 姓名 | Bae, Jongsuck | |||||||||||||||||||||
| 言語 | en | |||||||||||||||||||||
| 姓名 | 裵, 鐘石 | |||||||||||||||||||||
| 言語 | ja | |||||||||||||||||||||
| 姓名 | ベイ, ジョンソク | |||||||||||||||||||||
| 言語 | ja-Kana | |||||||||||||||||||||
| bibliographic_information |
en : APPLIED PHYSICS LETTERS 巻 71, 号 24, p. 3581-3583, 発行日 1997-10-14 |
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| 出版者 | ||||||||||||||||||||||
| 出版者 | American Institute of Physics | |||||||||||||||||||||
| 言語 | en | |||||||||||||||||||||
| ISSN | ||||||||||||||||||||||
| 収録物識別子タイプ | ISSN | |||||||||||||||||||||
| 収録物識別子 | 0003-6951 | |||||||||||||||||||||
| item_10001_source_id_32 | ||||||||||||||||||||||
| 収録物識別子タイプ | NCID | |||||||||||||||||||||
| 収録物識別子 | AA00543431 | |||||||||||||||||||||
| 出版タイプ | ||||||||||||||||||||||
| 出版タイプ | VoR | |||||||||||||||||||||
| 出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||||||||||||||||||
| item_10001_relation_34 | ||||||||||||||||||||||
| 関連タイプ | isIdenticalTo | |||||||||||||||||||||
| 識別子タイプ | DOI | |||||||||||||||||||||
| 関連識別子 | http://dx.doi.org/10.1063/1.120397 | |||||||||||||||||||||
| 関連名称 | 10.1063/1.120397 | |||||||||||||||||||||
| 内容記述 | ||||||||||||||||||||||
| 内容記述タイプ | Other | |||||||||||||||||||||
| 内容記述 | Scanning near-field optical microscopy using a slit-type probe is discussed. The slit-type probe has a width of much less than a wavelength, λ, and a length on the order of λ, and thus has high transmission efficiency. Two dimensional near-field images of objects have been constructed using an image reconstruction algorithm based on computerized tomographic imaging. Experiments performed at 60 GHz (λ = 5mm) show that this type of near-field microscopy can achieve a spatial resolution of better than λ/45 for two dimensional imaging. A method for fabricating a submicron width slit probe at the end of an optical fiber is presented for extending this microscopy to optical waves. | |||||||||||||||||||||
| 言語 | en | |||||||||||||||||||||
