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A Resonant Slit-Type Probe for Millimeter-Wave Scanning Near-Field Microscopy
https://nitech.repo.nii.ac.jp/records/5219
https://nitech.repo.nii.ac.jp/records/5219a743031c-f15c-4753-bf22-5bdc610ddbc5
| 名前 / ファイル | ライセンス | アクション |
|---|---|---|
本文_fulltext (688.2 kB)
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Copyright (c) 2004 IEICE http://search.ieice.org/index.html
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| Item type | 学術雑誌論文 / Journal Article(1) | |||||||||||||||||||
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| 公開日 | 2012-11-06 | |||||||||||||||||||
| タイトル | ||||||||||||||||||||
| タイトル | A Resonant Slit-Type Probe for Millimeter-Wave Scanning Near-Field Microscopy | |||||||||||||||||||
| 言語 | en | |||||||||||||||||||
| 言語 | ||||||||||||||||||||
| 言語 | eng | |||||||||||||||||||
| 資源タイプ | ||||||||||||||||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||||||||||||||||
| 資源タイプ | journal article | |||||||||||||||||||
| 著者 |
Nozokido, Tatsuo
× Nozokido, Tatsuo
× Obayashi, Tomohiro
× 裵, 鐘石
× Mizuno, Koji
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| 著者別名 | ||||||||||||||||||||
| 姓名 | Bae, Jongsuck | |||||||||||||||||||
| 言語 | en | |||||||||||||||||||
| 姓名 | 裵, 鐘石 | |||||||||||||||||||
| 言語 | ja | |||||||||||||||||||
| 姓名 | ベイ, ジョンソク | |||||||||||||||||||
| 言語 | ja-Kana | |||||||||||||||||||
| bibliographic_information |
en : IEICE transactions on electronics 巻 E87-C, 号 12, p. 2158-2163, 発行日 2004-12-01 |
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| 出版者 | ||||||||||||||||||||
| 出版者 | Institute of Electronics, Information and Communication Engineers | |||||||||||||||||||
| 言語 | en | |||||||||||||||||||
| ISSN | ||||||||||||||||||||
| 収録物識別子タイプ | ISSN | |||||||||||||||||||
| 収録物識別子 | 0916-8524 | |||||||||||||||||||
| item_10001_source_id_32 | ||||||||||||||||||||
| 収録物識別子タイプ | NCID | |||||||||||||||||||
| 収録物識別子 | AA10826283 | |||||||||||||||||||
| 出版タイプ | ||||||||||||||||||||
| 出版タイプ | VoR | |||||||||||||||||||
| 出版タイプResource | http://purl.org/coar/version/c_970fb48d4fbd8a85 | |||||||||||||||||||
| 内容記述 | ||||||||||||||||||||
| 内容記述タイプ | Other | |||||||||||||||||||
| 内容記述 | A resonant slit-type probe is proposed in this paper that can improve measurement sensitivity in millimeter-wave scanning near-field microscopy. The probe consists of a rectangular metal waveguide incorporating the following three sections; a straight section at the tip of the probe whose height is much smaller than the operating wavelength; a standard-height waveguide section; a quarter-wave transformer section to achieve impedance-matching between the other sections. The design procedure used for the probe is presented in detail and the performance of the fabricated resonant probe is evaluated experimentally. Experiments performed at U-band frequencies in which we reconstruct 2D images show that the sensitivity of the resonant probe is improved by more than four times compared with a conventional tapered slit-type probe. Some experimental results are compared with those obtained using the finite element method (Ansoft HFSS). Good agreement is demonstrated. | |||||||||||||||||||
| 言語 | en | |||||||||||||||||||
